Researcher profile

Thomas Gisler

Thomas Gisler contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2022arXiv

Soft-clamped silicon nitride string resonators at millikelvin temperatures

We demonstrate that soft-clamped silicon nitride strings with large aspect ratio can be operated at \si{\milli\kelvin} temperatures. The quality factors ($Q$) of two measured devices show consistent dependency on the cryostat temperature, with soft-clamped mechanical modes reaching $Q > 10^9$ at $46~\mathrm{mK}$. For low optical readout power, $Q$ is found to saturate, indicating good thermalization between the sample and the stage it is mounted on. Our best device exhibits a force sensitivity of $9.6~\mathrm{zN}/\sqrt{\mathrm{Hz}}$ and a thermal decoherence time of $0.38~\mathrm{s}$ which bode well for future applications such as nanomechanical force sensing and beyond.

preprint2020arXiv

Membrane-based scanning force microscopy

We report the development of a scanning force microscope based on an ultra-sensitive silicon nitride membrane transducer. Our development is made possible by inverting the standard microscope geometry - in our instrument, the substrate is vibrating and the scanning tip is at rest. We present first topography images of samples placed on the membrane surface. Our measurements demonstrate that the membrane retains an excellent force sensitivity when loaded with samples and in the presence of a scanning tip. We discuss the prospects and limitations of our instrument as a quantum-limited force sensor and imaging tool.