Measurement of the Penetration Depth and Coherence Length of MgB in All Directions Using Transmission Electron Microscopy
We demonstrate that images of flux vortices in a superconductor taken with a transmission electron microscope can be used to measure the penetration depth and coherence length in all directions at the same temperature and magnetic field. This is particularly useful for MgB, where these quantities vary with the applied magnetic field and values are difficult to obtain at low field or in the -direction. We obtained images of flux vortices from an MgB single crystal cut in the plane by focussed ion beam milling and tilted to with respect to the electron beam about its axis. A new method was developed to simulate these images which accounted for vortices with a non-zero core in a thin, anisotropic superconductor and a simplex algorithm was used to make a quantitative comparison between the images and simulations to measure the penetration depths and coherence lengths. This gave penetration depths nm and nm at 10.8 K in a field of 4.8 mT. The large error in is a consequence of tilting the sample about and had it been tilted about , the errors would be reversed. Thus, obtaining the most precise values requires taking images of the flux lattice with the sample tilted in more than one direction. In a previous paper, we obtained a more precise value using a sample cut in the plane. Using this value gives nm, nm, nm and nm which agree well with measurements made using other techniques. The experiment required two days to conduct and does not require large-scale facilities. It was performed on a very small sample: microns and 200 nm thick so this method could prove useful for characterising new superconductors where only small single crystals are available.