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Samuel Tardif

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Published work

8 published item(s)

preprint2022arXiv

Brittle fracture studied by ultra-high speed synchrotron X-ray diffraction imaging

Ever since the very first human-made knapped tools, the control of fracture propagation in brittle materials has been a vector of technological development. Nowadays, a broad range of applications relies on crack propagation control, from the mitigation of damages, e.g., from impacts in glass screens or windshields, to industrial processes harnessing fracture to achieve clean cuts over large distances. Yet, studying the fracture in real time is a challenging task, since cracks can propagate up to a few km/s in materials that are often opaque. Here, we report on the in situ investigation of cracks propagating at up to 2.5 km/s along a (001) plane of a silicon single crystal, using X-ray diffraction megahertz imaging with intense and time-structured synchrotron radiation. The studied system is based on the Smart Cut process, where a buried layer in a material (typically Si) is weakened by micro-cracks and then used to drive a macroscopic crack (0.1 m) in a plane parallel to the surface with minimal deviation (1 nm). The results we report here provide the first direct confirmation that the shape of the crack front is not affected by the distribution of the micro-cracks, which had been a postulate for previous studies based on post-fracture results. We further measured instantaneous crack velocities over the centimeter-wide field-of-view, which had only been previously inferred from sparse point measurements, and evidence the effect of local heating by the X-ray beam. Finally, we also observed the post-crack movements of the separated wafer parts, which can be explained using pneumatics and elasticity. Thus, this study provides a comprehensive view of controlled fracture propagation in a crystalline material, paving the way for the in situ measurement of ultra-fast strain field propagation.

preprint2020arXiv

Contribution of X-ray experiments and modeling to the understanding of the heterogeneous lithiation of graphite electrodes

Distributions of potential and lithium content inside lithium ion batteries highly affects their performance and durability. An increased heterogeneity of the lithium distribution is expected in thick electrodes with high energy densities or cycling at high currents. To optimize electrodes and cells designs, it is crucial to probe lithium concentration gradients across the depth of the electrode, but also to predict their occurrence and magnitude as a function of materials properties. Here, we follow the lithium distribution across a $80~μm$ thick porous graphite electrode using a $1~μm$ focused synchrotron X-ray beam. The sequential formation of the individual Li$_x$C$_6$ phases during lithium de-insertion is extracted from X-ray diffraction patterns, allowing the quantification of lithium concentration across the electrode thickness. Analyzing the evolution of heterogeneities as a function of time, we recover the striking features we predicted with a porous electrode model, including the succession of homogeneous and heterogeneous distributions of lithium. However, a clear difference is obtained at high stoichiometry, with a much more homogeneous distribution than initially predicted. Revisiting the interplay between transport and kinetic transfers limitations in the porous electrode model, we suggest that the kinetics of lithium (de)-insertion is highly reduced during the LiC$_6$/LiC$_{12}$ phase transition.

preprint2016arXiv

Lattice strain and tilt mapping in stressed Ge microstructures using X-ray Laue micro-diffraction and rainbow-filtering

Micro-Laue diffraction and simultaneous rainbow-filtered micro-diffraction were used to measure accurately the full strain tensor and the lattice orientation distribution at the sub-micron scale in highly strained, suspended Ge micro-devices. A numerical approach to obtain the full strain tensor from the deviatoric strain measurement alone is also demonstrated and used for faster full strain mapping. We performed the measurements in a series of micro-devices under either uniaxial or biaxial stress and found an excellent agreement with numerical simulations. This shows the superior potential of Laue micro-diffraction for the investigation of highly strained micro-devices.

preprint2014arXiv

All-in/all-out magnetic domains: X-ray diffraction imaging and magnetic field control

Long-range non-collinear all-in/all-out magnetic order has been directly observed for the first time in real space in the pyrochlore Cd$_2$Os$_2$O$_7$ using resonant magnetic microdiffraction at the Os L$_3$ edge. Two different antiferromagnetic domains related by time-reversal symmetry could be distinguished and have been mapped within the same single crystal. The two types of domains are akin to magnetic twins and were expected - yet unobserved so far - in the all-in/all-out model. Even though the magnetic domains are antiferromagnetic, we show that their distribution can be controlled using a magnetic field-cooling procedure.

preprint2013arXiv

X-ray magnetic circular dichroism in (Ge,Mn) compounds: experiments and modeling

X-ray absorption (XAS) and x-ray magnetic circular dichroism (XMCD) spectra at the L$_{2,3}$ edges of Mn in (Ge,Mn) compounds have been measured and are compared to the results of first principles calculation. Early \textit{ab initio} studies show that the Density Functional Theory (DFT) can very well describe the valence band electronic properties but fails to reproduce a characteristic change of sign in the L$_{3}$ XMCD spectrum of Mn in Ge$_3$Mn$_5$, which is observed in experiments. In this work we demonstrate that this disagreement is partially related to an underestimation of the exchange splitting of Mn 2$p$ core states within the local density approximation. It is shown that the change in sign experimentally observed is reproduced if the exchange splitting is accurately calculated within the Hartree-Fock approximation, while the final states can be still described by the DFT. This approach is further used to calculate the XMCD in different (Ge,Mn) compounds. It demonstrates that the agreement between experimental and theoretical spectra can be improved by combining state of the art calculations for the core and valence states respectively.

preprint2012arXiv

Improvements and considerations for size distribution retrieval from small-angle scattering data by Monte-Carlo methods

Monte-Carlo (MC) methods, based on random updates and the trial-and-error principle, are well suited to retrieve particle size distributions from small-angle scattering patterns of dilute solutions of scatterers. The size sensitivity of size determination methods in relation to the range of scattering vectors covered by the data is discussed. Improvements are presented to existing MC methods in which the particle shape is assumed to be known. A discussion of the problems with the ambiguous convergence criteria of the MC methods are given and a convergence criterion is proposed, which also allows the determination of uncertainties on the determined size distributions.

preprint2012arXiv

Interface-driven phase separation in multifunctional materials: the case of GeMn ferromagnetic semiconductor

We use extensive first principle simulations to show the major role played by interfaces in the mechanism of phase separation observed in semiconductor multifunctional materials. We make an analogy with the precipitation sequence observed in over-saturated AlCu alloys, and replace the Guinier-Preston zones in this new context. A new class of materials, the $α$ phases, is proposed to understand the formation of the coherent precipitates observed in the GeMn system. The interplay between formation and interface energies is analyzed for these phases and for the structures usually considered in the literature. The existence of the alpha phases is assessed with both theoretical and experimental arguments.

preprint2012arXiv

The optimal division between sample and background measurement time for photon counting experiments

Usually, equal time is given to measuring the background and the sample, or even a longer background measurement is taken as it has so few counts. While this seems the right thing to do, the relative error after background subtraction improves when more time is spent counting the measurement with the highest amount of scattering. As the available measurement time is always limited, a good division must be found between measuring the background and sample, so that the uncertainty of the background-subtracted intensity is as low as possible. Herein outlined is the method to determine how best to divide measurement time between a sample and the background, in order to minimize the relative uncertainty. Also given is the relative reduction in uncertainty to be gained from the considered division. It is particularly useful in the case of scanning diffractometers, including the likes of Bonse-Hart cameras, where the measurement time division for each point can be optimized depending on the signal-to-noise ratio.