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Sahar Keshavarz

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cond-mat.mes-hall cond-mat.mtrl-sci physics.ins-det

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preprint2016arXiv

Investigation of the tunnel magnetoresistance in junctions with a strontium stannate barrier

We experimentally investigate the structural, magnetic and electrical transport properties of La $_{0.67}$ Sr $_{0.33}$ MnO $_{3}$ based magnetic tunnel junctions with a SrSnO $_3$ barrier. Our results show that despite the large number of defects in the strontium stannate barrier, due to the large lattice mismatch, the observed tunnel magnetoresistance is comparable to tunnel junctions with a better lattice matched STiO $_3$ barrier, reaching values of up to 350% at T=5 K. Further analysis of the current-voltage characteristics of the junction and the bias voltage dependence of the observed tunnel magnetoresistance show a decrease of the TMR with increasing bias voltage. In addition, the observed TMR vanishes for T>200 K. Our results suggest that by employing a better lattice matched ferromagnetic electrode and thus reducing the structural defects in the strontium stannate barrier even larger TMR ratios might be possible in the future.

preprint2014arXiv

Cross-spectrum Analyzer for Low Frequency Noise Analysis

The design and performance of a sensitive and reliable cross-correlation spectrum analyzer for studying low frequency transport noise is described in detail. The design makes use of common PC-based data acquisition hardware and preamplifiers to acquire time-based data, along with software we have developed to compute the cross-correlation and noise spectral density. The impedance of device under test may cover four decades from ${100\,Ω}$ to ${1\,{\mathrm{M}Ω}}$ . By utilizing a custom developed signal processing program, this system is tested to be accurate and efficient for measuring voltage noise as low as $\sim\!10^{-19}\,\mathrm{V}^2/\mathrm{Hz}$ from ${0.001\,}$ Hz to ${100\,}$ kHz within one day's averaging time, comparable with more expensive hardware solutions (bandwidth in real measurements may be limited by the sample impedance and stray capacitance). The time dependence of measurement sensitivity is discussed theoretically and characterized experimentally to optimize between measuring time and accuracy. A routine for noise component analysis is introduced, and is applied for characterizing the noise spectra of metal and carbon film resistors, revealing an almost strict $1/$ frequency dependence that may reflect an ensemble of random resistivity fluctuation processes with uniformly distributed activation energies. These results verify the general applicability of this analyzer for low level noise researches.

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