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Ritwick Das

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Published work

2 published item(s)

preprint2022arXiv

Impact of Pauli-blocking effect on optical limiting properties of WSe2 thin films

We present a detailed investigation on thickness-dependent third-order (\c{hi}^(3)) nonlinear optical properties of RF-sputtered WSe2 thin-films using ultrashort pulses centered at different excitation wavelengths. The single-beam Z-scan based investigation in the visible spectrum reveals the prominent role of Pauli-blocking towards inducing saturable absorption or optical limiting in WSe2 thin-films of various thicknesses. The study also explores the dispersion in third-order nonlinear susceptibility (\c{hi}^(3)) in WSe2 thin films. Interestingly, WSe2 thin-films of any thickness exhibit a self-focusing effect depicting a positive nonlinear refractive index (n2 > 0). The frequency-dependent nonlinear absorption (\b{eta}) bear distinct correlations with the bandgap of the films which is also investigated through density-functional-theory (DFT) based simulations. The alteration in bandstructure is primarily due to the Se-deficiency induced defect bands in WSe2 thin-films which has discernible impact on the optical limiting characteristics.

preprint2019arXiv

Multiple reflection assisted Laser Doppler Vibrometer setup for high resolution displacement measurement

Non-intrusive displacement measurement technique has a distinct edge over displacement sensors working in contact mode. Laser Doppler Vibrometry based schemes (LDV) offer such an advantage. However, the measurements are limited up to $λ/4$, where $λ$ is the wavelength of optical source. An experimental design of high resolution non-intrusive displacement sensor working on the principle of basic LDV is being presented here. Resolution enhancement has been achieved through phase multiplication using multiple reflections within a high-Q cavity created by a vibrating surface and a high reflection mirror kept parallel to each other. Displacement of 72 $nm$ has been measured with an error range of $\pm 14$ $nm$ through direct counting of characteristic peaks in "half cycle" of the interferogram. The experimental design offers a straightforward route to measure displacement and the measurement resolution is mainly limited by the reflectivity and physical dimension of moving source.