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Richard Leahy

Richard Leahy contributes to research discovery and scholarly infrastructure.

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Published work

3 published item(s)

preprint2022arXiv

Deep Quantile Regression for Uncertainty Estimation in Unsupervised and Supervised Lesion Detection

Despite impressive state-of-the-art performance on a wide variety of machine learning tasks, deep learning methods can produce over-confident predictions, particularly with limited training data. Therefore, quantifying uncertainty is particularly important in critical applications such as lesion detection and clinical diagnosis, where a realistic assessment of uncertainty is essential in determining surgical margins, disease status and appropriate treatment. In this work, we propose a novel approach that uses quantile regression for quantifying aleatoric uncertainty in both supervised and unsupervised lesion detection problems. The resulting confidence intervals can be used for lesion detection and segmentation. In the unsupervised setting, we combine quantile regression with the Variational AutoEncoder (VAE). Here we address the problem of quantifying uncertainty in the images that are reconstructed by the VAE as the basis for principled outlier or lesion detection. The VAE models the output as a conditionally independent Gaussian characterized by its mean and variance. Unfortunately, joint optimization of both mean and variance in the VAE leads to the well-known problem of shrinkage or underestimation of variance. Here we describe an alternative Quantile-Regression VAE (QR-VAE) that avoids this variance shrinkage problem by directly estimating conditional quantiles for the input image. Using the estimated quantiles, we compute the conditional mean and variance for the input image from which we then detect outliers by thresholding at a false-discovery-rate corrected p-value. In the supervised setting, we develop binary quantile regression (BQR) for the supervised lesion segmentation task. We show how BQR can be used to capture uncertainty in lesion boundaries in a manner that characterizes expert disagreement.

preprint2022arXiv

Learning From Positive and Unlabeled Data Using Observer-GAN

The problem of learning from positive and unlabeled data (A.K.A. PU learning) has been studied in a binary (i.e., positive versus negative) classification setting, where the input data consist of (1) observations from the positive class and their corresponding labels, (2) unlabeled observations from both positive and negative classes. Generative Adversarial Networks (GANs) have been used to reduce the problem to the supervised setting with the advantage that supervised learning has state-of-the-art accuracy in classification tasks. In order to generate \textit{pseudo}-negative observations, GANs are trained on positive and unlabeled observations with a modified loss. Using both positive and \textit{pseudo}-negative observations leads to a supervised learning setting. The generation of pseudo-negative observations that are realistic enough to replace missing negative class samples is a bottleneck for current GAN-based algorithms. By including an additional classifier into the GAN architecture, we provide a novel GAN-based approach. In our suggested method, the GAN discriminator instructs the generator only to produce samples that fall into the unlabeled data distribution, while a second classifier (observer) network monitors the GAN training to: (i) prevent the generated samples from falling into the positive distribution; and (ii) learn the features that are the key distinction between the positive and negative observations. Experiments on four image datasets demonstrate that our trained observer network performs better than existing techniques in discriminating between real unseen positive and negative samples.

preprint2020arXiv

3D Phase Retrieval at Nano-Scale via Accelerated Wirtinger Flow

Imaging 3D nano-structures at very high resolution is crucial in a variety of scientific fields. However, due to fundamental limitations of light propagation we can only measure the object indirectly via 2D intensity measurements of the 3D specimen through highly nonlinear projection mappings where a variety of information (including phase) is lost. Reconstruction therefore involves inverting highly non-linear and seemingly non-invertible mappings. In this paper, we introduce a novel technique where the 3D object is directly reconstructed from an accurate non-linear propagation model. Furthermore, we characterize the ambiguities of this model and leverage a priori knowledge to mitigate their effect and also significantly reduce the required number of measurements and hence the acquisition time. We demonstrate the performance of our algorithm via numerical experiments aimed at nano-scale reconstruction of 3D integrated circuits. Moreover, we provide rigorous theoretical guarantees for convergence to stationarity.