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Richard G. Forbes

Richard G. Forbes appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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cond-mat.mes-hallphysics.app-phcond-mat.mtrl-sciquant-phphysics.data-anphysics.hist-phphysics.ins-det

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Published work

12 published item(s)

preprint2022arXiv

21st Century Planar Field Emission Theory and its Role in Vacuum Breakdown Science

For explaining electrical breakdown, field electron emission (FE) is a mechanism of interest. In the period 2006 to 2010 there were significant developments in basic FE theory, but these have not yet fully entered general thinking in technological FE areas, which are often still based on 1960s thinking or (in some contexts) 1920s thinking about FE theory. This paper outlines the history of FE theory and provides an overview of modern developments and of some related topics, in so far as these affect the interpretation of experiments and the explanation of physical phenomena. The paper concentrates on principles, with references given where details can be found. Some suggestions are made about moving to the use of "21st-Century" FE theory. In addition, an error in Feynman's treatment of the electrostatics of pointed conductors is displayed, and it is found that Zener tunneling is implausible as a primary cause of vacuum breakdown from a CuO overlayer.

0 citations0 reviewsNo code linkedOpen access
preprint2022arXiv

Field emission: calculations supporting a new methodology of comparing theory with experiment

This paper presents a new methodology for making comparisons between the theory of field electron emission (FE) and experiment, and is intended as a "demonstration of concept". This methodology is based on the value of the exponent kappa that describes the power to which voltage is raised in the pre-exponential of a mathematical equation that describes (for an electronically ideal FE system) the dependence of measured emission current on measured voltage. The aim is to use experimental exponent-values kappa^expt in an attempt to decide between two alternative FE theories, for both of which allowable (but different) ranges of kappa have been established. At present, there is limited information on what contribution to the "total theoretical kappa" is made by the voltage-dependence of the notional emission area: this paper reports simulations intended to add to our knowledge about this, for four common assumed shapes of an emitter apex. The methodology is then applied to the choice between 1928/29 Fowler-Nordheim (FN) FE theory and 1956 Murphy-Good (MG) FE theory (which is a situation where it is theoretically certain that 1956 MG FE theory is "better physics" than 1928/29 FN FE theory). Like all previous attempts to reach the known correct theoretical conclusion by experimentally based argument, the outcome of the new methodology tends to favour MG FE theory, but is formally indecisive at this stage of discussion. There seems an urgent need for better methods of measuring kappa^expt and of establishing reliable experimental error limits.

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preprint2022arXiv

Interpretation of field emission current-voltage data: background theory and detailed simulation testing of a user-friendly webtool

In field electron emission (FE) studies, to interpret current-voltage data and extract characterization parameters, we use smooth planar metal-like emitter (SPME) methodology and a data-analysis plot. Three types exist: Millikan-Lauritsen (ML), Fowler-Nordheim (FN) and Murphy-Good (MG) plots. In SPME methodology, ML and FN plots are slightly curved but a MG plot is nearly straight. 1956 MG FE theory is better physics than 1928 FN theory, so we expect MG plots to be more precise than ML or FN plots. Current-voltage data are often converted: measured voltage to (apparent) macroscopic field, current to macroscopic current density. Thus, four different data-input forms exist. Over-simplified models of system behaviour are widely assumed. Whether simple use of a data-analysis plot is a valid interpretation method is often neglected. Published FE studies seem to contain a high incidence of spurious values for "field enhancement factor". A procedure (the "Orthodoxy Test") described in 2013 allows a validity check: around 40 % of a small sample of results were spuriously high. To assist data interpretation and validity checks, a simple user-friendly webtool has been designed by the lead author. As inputs, this needs system specification data and "range-limits" data from any of the three plot forms, using any of the four data-input forms. The webtool then applies the Orthodoxy Test, and -- if passed -- extracts characterization parameters. This study reports: (1) systematic tests of webtool functionality, using simulated input data prepared using Extended MG FE theory; and (2) systematic comparisons of the three different data-plot types, to check how well extracted parameter values match simulation input values. A summary review of relevant theory is given. For formal emission areas, the MG plot performs better than FN and ML plots. This is important for FE science.

0 citations0 reviewsNo code linkedOpen access
preprint2021arXiv

Comment on 'Design and circuit simulation of nanoscale vacuum channel transistors' by J. Xu, Y. Qin, Y. Shi, Y. Yang and X. Zhang, Nanoscale Adv. 2020, 2, 3582

These comments aim to correct some apparent weaknesses in the theory of field electron emission given in a recent paper about nanoscale vacuum channel transistors, and to improve the presentation of this theory. In particular, it is argued that a "simplified" formula stated in the paper should not be used, because this formula is known to under-predict emission current densities by a large factor (typically around 300 for an emitting surface with local work function 4.5 eV). Thus, the "simplified" formula may significantly under-predict the practical performance of a nanoscale vacuum channel transistor.

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preprint2020arXiv

Applying the field emission orthodoxy test to Murphy-Good plots

In field electron emission (FE) studies, it is important to check and analyse the quality and validity of results experimentally obtained from samples, using suitably plotted current-voltage [I(V)] measurements. For the traditional plotting method, the Fowler-Nordheim (FN) plot, there exists a so-called "orthodoxy test" that can be applied to the FN plot, in order to check whether the FE device/system generating the results is "ideal". If it is not ideal, then emitter characterization parameters deduced from the FN plot are likely to be spurious. A new form of FE I(V) data plot, the so-called "Murphy-Good (MG) plot" has recently been introduced (R.G. Forbes, Roy. Soc. Open Sci. 6 (2019) 190912. This aims to improve the precision with which characterization-parameter values (particularly values of formal emission area) can be extracted from FE I(V) data. The present paper compares this new plotting form with the older FN and Millikan-Lauritsen (ML) forms, and makes an independent assessment of the consistency with which slope (and hence scaled-field) estimates can be extracted from a MG plot. It is shown that, by using a revised formula for the extraction of scaled-field values, the existing orthodoxy test can be applied to Murphy-Good plots. The development is reported of a prototype web tool that can apply the orthodoxy test to all three forms of FE data plot (ML, MG and FN).

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preprint2020arXiv

Implementation of the orthodoxy test as a validity check on experimental field emission data

In field electron emission (FE) studies, it is important to check and analyse the quality and validity of experimental current-voltage data, which is usually plotted in one of a small number of standard forms. These include the so-called Fowler-Nordheim (FN), Millikan-Lauritsen (ML) and Murphy-Good (MG) plots. The Field Emission Orthodoxy Test is a simple quantitative test that aims to check for the reasonableness of the values of the parameter "scaled field" that can be extracted from these plots. This is done in order to establish whether characterization parameters extracted from the plot will be reliable or, alternative, likely to be spurious. This paper summarises the theory behind the orthodoxy test, for each of the plot forms, and confirms that it is easy to apply it to the newly developed MG plot. A simple web tool has been developed that extracts scaled-field values from any of these three plot forms, and tests for lack of field emission orthodoxy.

0 citations0 reviewsNo code linkedOpen access
preprint2020arXiv

Modeling the Field Emission Enhancement Factor for Capped Carbon Nanotubes using the Induced Electron Density

In many field electron emission experiments on single-walled carbon nanotubes (SWCNTs), the SWCNT stands on one of two well-separated parallel plane plates, with a macroscopic field FM applied between them. For any given location "L" on the SWCNT surface, a field enhancement factor (FEF) is defined as $F_{\rm{L}}$/$F_{\rm{M}}$, where $F_{\rm{L}}$ is a local field defined at "L". The best emission measurements from small-radii capped SWCNTs exhibit characteristic FEFs that are constant (i.e., independent of $F_{\rm{M}}$). This paper discusses how to retrieve this result in quantum-mechanical (as opposed to classical electrostatic) calculations. Density functional theory (DFT) is used to analyze the properties of two short, floating SWCNTS, capped at both ends, namely a (6,6) and a (10,0) structure. Both have effectively the same height ($\sim 5.46$ nm) and radius ($\sim 0.42$ nm). It is found that apex values of local induced FEF are similar for the two SWCNTs, are independent of $F_{\rm{M}}$, and are similar to FEF-values found from classical conductor models. It is suggested that these induced-FEF values relate to the SWCNT longitudinal system polarizabilities, which are presumed similar. The DFT calculations also generate "real", as opposed to ``induced", potential-energy (PE) barriers for the two SWCNTs, for FM-values from 3 V/$μ$m to 2 V/nm. PE profiles along the SWCNT axis and along a parallel ``observation line" through one of the topmost atoms are similar. At low macroscopic fields the details of barrier shape differ for the two SWCNT types. Even for $F_{\rm{M}}=0$, there are distinct PE structures present at the emitter apex (different for the two SWCNTs); this suggests the presence of structure-specific chemically induced charge transfers and related patch-field distributions.

0 citations0 reviewsNo code linkedOpen access
preprint2019arXiv

Comments on the continuing widespread and unnecessary use of a defective emission equation in field emission related literature

Field electron emission (FE) has relevance in many different technological contexts. However, many related technological papers use a physically defective elementary FE equation for local emission current density (LECD). This equation takes the tunneling barrier as exactly triangular, as in the original FE theory of 90 years ago. More than 60 years ago, it was shown that the so-called Schottky-Nordheim (SN) barrier, which includes an image-potential-energy term (that models exchange-and-correlation effects) is better physics. For a metal-like emitter with work-function 4.5 eV, the SN-barrier-related Murphy-Good FE equation predicts LECD values that are higher than the elementary equation values by a large factor, often between around 250 and around 500. By failing to mention/apply this 60-year-old established science, or to inform readers of the large errors associated with the elementary equation, many papers (aided by defective reviewing) spread a new kind of "pathological science", and create a modern research-integrity problem. The present paper aims to enhance author and reviewer awareness by summarizing relevant aspects of FE theory, by explicitly identifying the misjudgment in the original 1928 Fowler-Nordheim paper, by explicitly calculating the size of the resulting error, and by showing in detail why most FE theoreticians regard the 1950s modifications as better physics. Suggestions are made, about nomenclature and about citation practice, that may help to diminish misunderstandings.

0 citations0 reviewsNo code linkedOpen access
preprint2019arXiv

On the quantum mechanics of how an ideal carbon nanotube field emitter can exhibit a constant field enhancement factor

Measurements of current-voltage characteristics from ideal carbon nanotube (CNT) field electron emitters of small apex radius have shown that these emitters can exhibit a linear Fowler-Nordheim (FN) plot [e.g., Dean and Chalamala, Appl. Phys. Lett., 76, 375, 2000]. From such a plot, a constant (voltage-independent) characteristic field enhancement factor (FEF) can be deduced. Over fifteen years later, this experimental result has not yet been convincingly retrieved from first-principles electronic structure calculations, or more generally from quantum mechanics (QM). On the contrary, several QM calculations have deduced that the characteristic FEF should be a function of the macroscopic field applied to the CNT. This apparent contradiction between experiment and QM theory has been an unexplained feature of CNT emission science, and has raised doubts about the ability of existing QM models to satisfactorily describe experimental CNT emission behavior. In this work we demonstrate, by means of a density functional theory analysis of single-walled CNTs "floating" in an applied macroscopic field, the following significant result. This is that agreement between experiment, classical-conductor CNT models and QM calculations can be achieved if the latter are used to calculate (from the "real" total-charge-density distributions initially obtained) the distributions of $\textit{induced}$ charge-density, induced local fields and induced local FEFs. The present work confirms, more reliably and in significantly greater detail than in earlier work on a different system, that this finding applies to the common "post-on-a-conducing plane" situation of CNT field electron emission. This finding also brings out various further theoretical questions that need to be explored.

0 citations0 reviewsNo code linkedOpen access
preprint2016arXiv

Fowler-Nordheim Plot Analysis: a Progress Report

The commonest method of characterizing a cold field electron emitter is to measure its current-voltage characteristics, and the commonest method of analysing these characteristics is by means of a Fowler-Nordheim (FN) plot. This tutorial/review-type paper outlines a more systematic method of setting out the Fowler-Nordheim-type theory of cold field electron emission, and brings together and summarises the current state of work by the authors on developing the theory and methodology of FN plot analysis. This has turned out to be far more complicated than originally expected. Emphasis is placed in this paper on: (a) the interpretation of FN-plot slopes, which is currently both easier and of more experimental interest than the analysis of FN-plot intercepts; and (b) preliminary explorations into developing methodology for interpreting current-voltage characteristics when there is series resistance in the conduction path from the high-voltage generator to the emitter's emitting regions. This work reinforces our view that FN-plot analysis is best carried out on the raw measured current-voltage data, without pre-conversion into another data format, particularly if series resistance is present in the measuring circuit. Relevant formulae are given for extracting field-enhancement-factor values from such an analysis.

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preprint2015arXiv

ISQ derivation ("derivation in SI units") of a formula for the electrostatic field ionization rate-constant for a hydrogenic atom in its ground electronic state

Technical applications using electrostatic field ionization (ESFI) need a formula for the rate-constant K_e for the free-space ESFI of a hydrogenic atom in its ground electronic state. This formula must indicate the dependence on ionization energy I. Existing formulae were derived using atomic units. However, many scientists work with ESFI as an important technical process, but are not familiar with the Gaussian or atomic units systems. In the 1970s, the present International System of Quantities (ISQ), which includes the equations behind SI units, was designated as the main system for university teaching and the communication of scientific equations. 40 years on, ISQ derivations of ESFI rate-constant formulae are still not easily found, but are now needed. This tutorial paper gives a detailed ISQ derivation of a formula for K_e. The derivation is closely modelled on the Landau and Lifshitz (LL) approach used in their 1958 work (in atomic units) on hydrogen atom ESFI. The ISQ derivation confirms that, for hydrogenic atoms, ionization energy appears in the pre-exponential as I^(5/2), and defines a universal "field ionization constant". It also shows how the ISQ formula relates to the Gurney and Condon "attempt frequency" form for tunnelling rate-constants, and an ISQ formula is given for the motive energy in the related JWKB integral. The ISQ derivation uses a motive-energy transformation analogous to a transformation used by LL. The need for this transformation in ESFI theory raises questions as to the correctness of theoretical treatments of field electron emission from non-planar emitters, which do not make this transformation.

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preprint2010arXiv

Analytical treatment of cold field electron emission from a nanowall emitter

This paper presents an elementary, approximate analytical treatment of cold field electron emission (CFE) from a classical nanowall. A simple model is used to bring out some of the basic physics of a class of field emitter where quantum confinement effects exist transverse to the emitting direction. A high-level methodology is presented for developing CFE equations more general than the usual Fowler-Nordheim-type (FN-type) equations, and is applied to the classical nanowall. If the nanowall is sufficiently thin, then significant transverse-energy quantization effects occur, and affect the overall form of theoretical CFE equations; also, the tunnelling barrier shape exhibits "fall-off" in the local field value with distance from the surface. A conformal transformation technique is used to derive an analytical expression for the on-axis tunnelling probability.

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