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Ranran Li

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Published work

3 published item(s)

preprint2022arXiv

Magnetic phase transition induced ferroelectric polarization in BaFeF4 with room temperature weak ferromagnetism

BaMF4 (M=Fe, Co, Ni and Mn) family are typical multiferroic materials, having antiferromagnetism at around liquid nitrogen temperature. In this work, polycrystalline BaFeF4 has been prepared by solid state reaction. The slight deficiency of Fe leads to the coexistence of valence states of +2 and +3, facilitating the electrons to hop between the neighboring Fe2+ and Fe3+ ions through the middle F- ion, leading to the strong double exchange interaction with weak ferromagnetism above room temperature. A bifurcation at about 170 K between the zero-field-cooled and field-cooled temperature dependent magnetization curves indicates the onset of 2-dimensional antiferromagnetism, which is completed at about 125 K with the sudden drop of magnetization. Despite the fact of type-I multiferroic, its magnetoelectricity can be evidenced by the pyroelectric current, which shows a peak starting at about 170 K and finishing at about 125 K. The saturated ferroelectric polarization change of around 34 μC/m2 is observed, which is switchable by the reversed poling electric field and decreases to about 30 μC/m2 under a magnetic field of 90 kOe. This magnetoelectricity can be qualitatively reproduced by first-principles calculations. Our results represent substantial progress to search for high-temperature multiferroics in ferroelectric fluorides.

preprint2020arXiv

Detecting Band Profiles of Devices with Conductive Atomic Force Microscopy

Band profiles of electronic devices are of fundamental importance in determining their properties. A technique that can map the band profile of both the interior and edges of a device at the nanometer scale is highly demanded. Conventional scanning tunneling spectroscopy (STS) can map band structure at the atomic scale, but is limited to the interior of large and conductive samples. Here we develop a contact-mode STS based on conductive atomic force microscope that can remove these constraints. With this technique, we map the band profile of MoS$_2$ transistors with nanometer resolution at room temperature. A band bending of 0.6 eV within 18 nm of the edges of MoS$_2$ on insulating substrate is discovered. This technique will be of great use for both fundamental and applied studies of various electronic devices.

preprint2016arXiv

2D SnS: a phosphorene analogue with strong in-plane electronic anisotropy

We study the anisotropic electronic properties of 2D SnS, an analogue of phosphorene, grown by physical vapor transport. With transmission electron microscope and polarized Raman spectroscopy, we identify the zigzag and armchair directions of the as-grown 2D crystals. 2D SnS field-effect transistors with a cross-Hall-bar structure are fabricated. They show heavily hole-doped (~10$^{19}$ cm$^{-3}$) conductivity with strong in-plane anisotropy. At room temperature the mobility along the zigzag direction exceeds 20 cm$^{2}$V$^{-1}$s$^{-1}$, which can be up to 1.7 times of that in the armchair direction. This strong anisotropy is then explained by the effective-mass ratio along the two directions and agrees well with previous theoretical predictions. Temperature-dependent carrier density is used to find out the acceptor energy level to be ~45 meV above the valence band maximum. This value matches with a calculated defect level of 42 meV for Sn vacancies, indicating that Sn deficiency is the main cause of the p-type conductivity.