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Chenglei Guo

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Published work

2 published item(s)

preprint2016arXiv

2D SnS: a phosphorene analogue with strong in-plane electronic anisotropy

We study the anisotropic electronic properties of 2D SnS, an analogue of phosphorene, grown by physical vapor transport. With transmission electron microscope and polarized Raman spectroscopy, we identify the zigzag and armchair directions of the as-grown 2D crystals. 2D SnS field-effect transistors with a cross-Hall-bar structure are fabricated. They show heavily hole-doped (~10$^{19}$ cm$^{-3}$) conductivity with strong in-plane anisotropy. At room temperature the mobility along the zigzag direction exceeds 20 cm$^{2}$V$^{-1}$s$^{-1}$, which can be up to 1.7 times of that in the armchair direction. This strong anisotropy is then explained by the effective-mass ratio along the two directions and agrees well with previous theoretical predictions. Temperature-dependent carrier density is used to find out the acceptor energy level to be ~45 meV above the valence band maximum. This value matches with a calculated defect level of 42 meV for Sn vacancies, indicating that Sn deficiency is the main cause of the p-type conductivity.

preprint2016arXiv

Field-effect transistors of high-mobility few-layer SnSe$_{2}$

We report the transport properties of mechanically exfoliated few-layer SnSe$_{2}$ flakes, whose mobility is found with four probe measurements to be ~ 85 cm$^{2}$V$^{-1}$s$^{-1}$ at 300 K, higher than those of the majority of few-layer transitional metal dichalcogenides (TMDs). The mobility increases strongly with decreased temperature, indicating a phonon limited transport. The conductivity of the semiconducting SnSe$_{2}$ shows a metallic behavior, which is explained by two competing factors involving the different temperature dependence of mobility and carrier density. The Fermi level is found to be 87 meV below the conduction band minima (CBM) at 300 K and 12 meV below the CBM at 78 K, resulting from a heavy n-type doping. Previous studies have found SnSe$_{2}$ field-effect transistors (FETs) to be very difficult to turn off. We find the limiting factor to be the flake thickness compared with the maximum depletion width. With fully depleted devices, we are able to achieve a current on-off ratio of ~10$^{5}$. These results demonstrate the great potential of SnSe2 as a two dimensional (2D) semiconducting material and are helpful for our understanding of other heavily doped 2D materials.