Researcher profile

Oliver Thimm

Oliver Thimm contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate

Trust snapshot

Quick read

Trust 11 - UnverifiedVerification L1Unclaimed author
1works
0followers
2topics
4close collaborators

Actions

Decide how to stay connected

Follow researcher0

Identity and collaboration

How to connect with this researcher

Claiming links this public author record to a researcher profile and unlocks direct collaboration workflows.

Log in to claim

Direct collaboration

Open a focused conversation when the fit is right

Claim this author entity first to unlock direct invitations.

Research graph

See the researcher in context

Open full explorer

Inspect adjacent work, topics, institutions and collaborators without jumping out to a separate graph page.

Building this graph slice

BZPEER is loading the nearby papers, people, topics and institutions for this page.

Published work

1 published item(s)

preprint2023arXiv

Comparing Methods of Characterizing Energetic Disorder in Organic Solar Cells

Energetic disorder has been known for decades to limit the performance of structurally disordered semiconductors such as amorphous silicon and organic semiconductors. However, in the past years, high performance organic solar cells have emerged showing a continuously reduced amount of energetic disorder. While searching for future high efficiency material systems, it is therefore important to correctly characterize this energetic disorder. While there are several techniques in literature, the most common approaches to probe the density of defect states are using optical excitation as in external quantum efficiency measurements or sequential filling of the tail states by applying an external voltage as in admittance spectroscopy. A metanalysis of available literature as well as our experiments using four characterization techniques on two material systems reveal that electrical, voltage-dependent measurements frequently yield higher values of energetic disorder than optical measurements. With drift-diffusion simulations, we demonstrate that the approaches probe different energy ranges of the subband-gap density of states. We further explore the limitations of the techniques and find that extraction of information from a capacitance-voltage curve can be inhibited by an internal series resistance. Thereby, we explain the discrepancies between measurements techniques with sensitivity to different energy ranges and electronic parameters.