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O. M. Bruno

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Computer Vision eess.IV Machine Learning physics.data-an

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preprint2020arXiv

Frequency domain kurtosis-based no-reference image quality assessment for bright-field microscopy images

In the last few years, image processing researchers spent a substantial amount of time and effort developing and perfecting image quality assessment algorithms. Bright-field microscopy, for example, produces images whose quality is a bottleneck for consistent evaluation. For instance, when a stack of images of a specimen is acquired in different focal plane configurations, there will be a set of blurred or partially blurred elements in it, impairing proper evaluation. This work aims to provide an image quality assessment metric, without the presence of a reference image for comparison, to detect the blurred and sharp images among the whole set of the stack, and elect the sharpest ones for a further fusion process. The correlation of the results with subjective labeling of the image sets showed that the proposed metric offers reliable identification of the eligible images for fusion and suggests the application in other real-world problems.

preprint2013arXiv

A systematic comparison of supervised classifiers

Pattern recognition techniques have been employed in a myriad of industrial, medical, commercial and academic applications. To tackle such a diversity of data, many techniques have been devised. However, despite the long tradition of pattern recognition research, there is no technique that yields the best classification in all scenarios. Therefore, the consideration of as many as possible techniques presents itself as an fundamental practice in applications aiming at high accuracy. Typical works comparing methods either emphasize the performance of a given algorithm in validation tests or systematically compare various algorithms, assuming that the practical use of these methods is done by experts. In many occasions, however, researchers have to deal with their practical classification tasks without an in-depth knowledge about the underlying mechanisms behind parameters. Actually, the adequate choice of classifiers and parameters alike in such practical circumstances constitutes a long-standing problem and is the subject of the current paper. We carried out a study on the performance of nine well-known classifiers implemented by the Weka framework and compared the dependence of the accuracy with their configuration parameter configurations. The analysis of performance with default parameters revealed that the k-nearest neighbors method exceeds by a large margin the other methods when high dimensional datasets are considered. When other configuration of parameters were allowed, we found that it is possible to improve the quality of SVM in more than 20% even if parameters are set randomly. Taken together, the investigation conducted in this paper suggests that, apart from the SVM implementation, Weka's default configuration of parameters provides an performance close the one achieved with the optimal configuration.

preprint2012arXiv

Texture Analysis And Characterization Using Probability Fractal Descriptors

A gray-level image texture descriptors based on fractal dimension estimation is proposed in this work. The proposed method estimates the fractal dimension using probability (Voss) method. The descriptors are computed applying a multiscale transform to the fractal dimension curves of the texture image. The proposed texture descriptor method is evaluated in a classification task of well known benchmark texture datasets. The results show the great performance of the proposed method as a tool for texture images analysis and characterization.