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Laser power metrology at the National Institute of Standards and Technology (NIST) ranges 20 orders of magnitude from photon-counting (1000 photons/s) to 100 kW (10^23 photons/s at a wavelength of 1070 nm). As a part of routine practices, we perform internal (unpublished) comparisons between our various power meters to verify correct operation.
Transition edge sensors (TES) have the highest reported efficiencies (>98%) for detection of single photons in the visible and near infrared. Experiments in quantum information and foundations of physics that rely critically on this efficiency have started incorporating these detectors into con- ventional quantum optics setups. However, their range of applicability has been hindered by slow operation both in recovery time and timing jitter. We show here how a conventional tungsten-TES can be operated with jitter times of < 4 ns, well within the timing resolution necessary for MHz clocking of experiments, and providing an important practical simplification for experiments that rely on the simultaneous closing of both efficiency and locality loopholes.
Integration is currently the only feasible route towards scalable photonic quantum processing devices that are sufficiently complex to be genuinely useful in computing, metrology, and simulation. Embedded on-chip detection will be critical to such devices. We demonstrate an integrated photon-number resolving detector, operating in the telecom band at 1550 nm, employing an evanescently coupled design that allows it to be placed at arbitrary locations within a planar circuit. Up to 5 photons are resolved in the guided optical mode via absorption from the evanescent field into a tungsten transition-edge sensor. The detection efficiency is 7.2 \pm 0.5 %. The polarization sensitivity of the detector is also demonstrated. Detailed modeling of device designs shows a clear and feasible route to reaching high detection efficiencies.
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