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Matvey Finkel

Matvey Finkel appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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cond-mat.mes-hall cond-mat.mtrl-sci physics.app-ph physics.ins-det physics.optics quant-ph

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preprint2019arXiv

Analysis of a single-mode waveguide at sub-terahertz frequencies as a communication channel

We study experimentally the transmission of an electro-magnetic waveguide in the frequency range from 160 to 300 GHz. Photo-mixing is used to excite and detect the fundamental TE10 mode in a rectangular waveguide with two orders-of-magnitude lower impedance. The large impedance mismatch leads to a strong frequency dependence of the transmission, which we measure with a high-dynamic range of up to 80 dB, and with high frequency-resolution. The modified transmission function is directly related to the information rate of the waveguide, which we estimate to be about 1 bit per photon. We suggest that the results are applicable to a Josephson junction employed as a single-photon source and coupled to a superconducting waveguide to achieve a simple on-demand narrow-bandwidth free-space number-state channel.

preprint2019arXiv

Local electrodynamics of a disordered conductor model system measured with a microwave impedance microscope

We study the electrodynamic impedance of percolating conductors with a pre-defined network topology using a scanning microwave impedance microscope (sMIM) at GHz frequencies. For a given percolation number we observe strong spatial variations across a sample which correlate with the connected regions (clusters) in the network when the resistivity is low such as in Aluminum. For the more resistive material NbTiN the impedance becomes dominated by the local structure of the percolating network (connectivity). The results can qualitatively be understood and reproduced with a network current spreading model based on the pseudo-inverse Laplacian of the underlying network graph.

preprint2016arXiv

Spatial conductivity mapping of unprotected and capped black phosphorus using microwave microscopy

Thin layers of black phosphorus present an ideal combination of a 2D material with a tunable direct bandgap and high carrier mobility. However the material suffers from degradation in ambient conditions due to an oxidation reaction which involves water, oxygen and light. We have measured the spatial profile of the conductivity on flakes of black phosphorus as a function of time using scanning microwave impedance microscopy. A microwave excitation (3 GHz) allows to image a conducting sample even when covered with a dielectric layer. We observe that on bare black phosphorus, the conductivity changes drastically over the whole surface within a day. We demonstrate that the degradation process is slowed down considerably by covering the material with a 10 nm layer of hafnium oxide. It is stable for more than a week, opening up a route towards stable black phosphorus devices in which the high dielectric constant of hafnium oxide can be exploited. Covering black phosphorus with a 15 nm boron nitride flake changes the degradation process qualitatively, it is dominated by the edges of the flake indicating a diffusive process and happens on the scale of days.