Researcher profile

Maksim Levental

Maksim Levental contributes to research discovery and scholarly infrastructure.

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Published work

3 published item(s)

preprint2022arXiv

Memory Planning for Deep Neural Networks

We study memory allocation patterns in DNNs during inference, in the context of large-scale systems. We observe that such memory allocation patterns, in the context of multi-threading, are subject to high latencies, due to \texttt{mutex} contention in the system memory allocator. Latencies incurred due to such \texttt{mutex} contention produce undesirable bottlenecks in user-facing services. Thus, we propose a "memorization" based technique, \texttt{MemoMalloc}, for optimizing overall latency, with only moderate increases in peak memory usage. Specifically, our technique consists of a runtime component, which captures all allocations and uniquely associates them with their high-level source operation, and a static analysis component, which constructs an efficient allocation "plan". We present an implementation of \texttt{MemoMalloc} in the PyTorch deep learning framework and evaluate memory consumption and execution performance on a wide range of DNN architectures. We find that \texttt{MemoMalloc} outperforms state-of-the-art general purpose memory allocators, with respect to DNN inference latency, by as much as 40\%.

preprint2022arXiv

Real-Time Streaming and Event-driven Control of Scientific Experiments

Advancements in scientific instrument sensors and connected devices provide unprecedented insight into ongoing experiments and present new opportunities for control, optimization, and steering. However, the diversity of sensors and heterogeneity of their data result in make it challenging to fully realize these new opportunities. Organizing and synthesizing diverse data streams in near-real-time requires both rich automation and Machine Learning (ML). To efficiently utilize ML during an experiment, the entire ML lifecycle must be addressed, including refining experiment configurations, retraining models, and applying decisions-tasks that require an equally diverse array of computational resources spanning centralized HPC to the accelerators at the edge. Here we present the Manufacturing Data and Machine Learning platform (MDML). The MDML is designed to standardize the research and operational environment for advanced data analytics and ML-enabled automated process optimization by providing the cyberinfrastructure to integrate sensor data streams and AI in cyber-physical systems for in-situ analysis. To achieve this, the MDML provides a fabric to receive and aggregate IoT data and simultaneously orchestrate remote computation across the computing continuum. In this paper we describe the MDML and show how it is used in advanced manufacturing to act on IoT data and orchestrate distributed ML to guide experiments.

preprint2022arXiv

Ultrafast Focus Detection for Automated Microscopy

Technological advancements in modern scientific instruments, such as scanning electron microscopes (SEMs), have significantly increased data acquisition rates and image resolutions enabling new questions to be explored; however, the resulting data volumes and velocities, combined with automated experiments, are quickly overwhelming scientists as there remain crucial steps that require human intervention, for example reviewing image focus. We present a fast out-of-focus detection algorithm for electron microscopy images collected serially and demonstrate that it can be used to provide near-real-time quality control for neuroscience workflows. Our technique, \textit{Multi-scale Histologic Feature Detection}, adapts classical computer vision techniques and is based on detecting various fine-grained histologic features. We exploit the inherent parallelism in the technique to employ GPU primitives in order to accelerate characterization. We show that our method can detect of out-of-focus conditions within just 20ms. To make these capabilities generally available, we deploy our feature detector as an on-demand service and show that it can be used to determine the degree of focus in approximately 230ms, enabling near-real-time use.