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M. F. Churbanov

M. F. Churbanov appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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Published work

3 published item(s)

preprint2014arXiv

Infrared luminescence in Bi-doped Ge-S and As-Ge-S chalcogenide glasses and fibers

Experimental and theoretical studies of spectral properties of chalcogenide Ge-S and As-Ge-S glasses and fibers are performed. A broad infrared (IR) luminescence band which covers the 1.2-2.3~$μ$m range with a lifetime about 6~$μ$s is discovered. Similar luminescence is also present in optical fibers drawn from these glasses. Arsenic addition to Ge-S glass significantly enhances both its resistance to crystallization and the intensity of the luminescence. Computer modeling of Bi-related centers shows that interstitial Bi$^+$ ions adjacent to negatively charged S vacancies are most likely responsible for the IR luminescence.

preprint2011arXiv

Optical absorption and structure of impurity Ni$^{2+}$ center in tungstate-tellurite glass

Absorption spectra of Ni$^{2+}$ ions in 22WO$_3$--78TeO$_2$ tungstate-tellurite glass were studied and Ni$^{2+}$ extinction coefficient spectral dependence was derived in the 450 -- 2700 nm wavelength range. Computer modeling of the glass structure proved Ni$^{2+}$ ions to be in trigonal-distorted octahedral environment in the tungstate-tellurite glass. Tanabe-Sugano diagram for such an environment was calculated and good description of the observed spectrum of Ni$^{2+}$ ion was obtained. Basing on both absorption spectral range width and the extinction coefficient, nickel should be considered among the most strongly absorbing impurities in the tellurite glasses.

preprint2011arXiv

Refractive index spectral dependence, Raman and transmission spectra of high-purity $^{28}$Si, $^{29}$Si, $^{30}$Si, and $^{nat}$Si single crystals

Precise measurement of the refractive index of stable silicon isotopes $^{28}$Si, $^{29}$Si, $^{30}$Si single crystals with enrichments above 99.9 at.% and a silicon single crystal $^{nat}$Si of natural isotopic composition is performed with the Fourier-transform interference refractometry method from 1.06 to more than 80 mkm with 0.1 cm$^{-1}$ resolution and accuracy of $2 \times 10^{-5} ... 1 \times 10^{-4}$. The oxygen and carbon concentrations in all crystals are within $5 \times 10^{15}$ cm$^{-3}$ and the content of metal impurities is $10^{-5} ... 10^{-6}$ at.%. The peculiar changes of the refractive index in the phonon absorption region of all silicon single crystals are shown. The coefficients of generalized Cauchy dispersion function approximating the experimental refractive index values all over the measuring range are given. The transmission and Raman spectra are also studied.