Researcher profile

Longbing He

Longbing He contributes to research discovery and scholarly infrastructure.

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Published work

3 published item(s)

preprint2012arXiv

Visualizing plasmon coupling in closely-spaced chains of Ag nanoparticles by electron energy loss spectroscopy

Anisotropic plasmon coupling in closely-spaced chains of Ag nanoparticles was visualized using the electron energy loss spectroscopy in a scanning transmission electron microscope. For dimers as the simplest chain, mapping the plasmon excitations with nanometers' spatial resolution and 0.27 eV energy resolution intuitively identified two coupling plasmons. The in-phase mode redshifted from the ultraviolet region as the inter-particle spacing was reduced, reaching the visible range at 2.7 eV. Calculations based on the discrete dipole approximation confirmed its optical activeness, where the longitudinal direction was constructed as the path for light transportation. Two coupling paths were then observed in an inflexed 4-particle chain.

preprint2010arXiv

Free-standing Graphene as Gold Standard

We demonstrate using graphene sheets as a novel mass standard in the scanning transmission electron microscopy (STEM) based mass spectrometry. Here, free-standing graphene sheets are investigated by STEM. The discrete number of graphene layers enables an accurate calibration of STEM intensity, as performed over an extended thickness and with single atomic layer sensitivity. This leads to the direct and accurate measurement of the electron mean free path. As an application, we gain the insight of carbon nanoparticles of complex structure.

preprint2010arXiv

Visualizing topological insulating Bi2Te3 quintuple layers on SiO2-capped Si substrates and its contrast optimization

Thin Bi2Te3 flakes, with as few as 3 quintuple layers, are optically visualized on the SiO2-capped Si substrates. Their optical contrasts vary with the illumination wavelength, flake thickness and capping layers. The maximum contrast appears at the optimized light with the 570nm wavelength. The contrast turns reversed when the flake is reduced to less than 20 quintuple layers. A calculation based on the Fresnel law describes the above observation with the constructions of the layer number-wave length-contrast three-dimensional (3D) diagram and the cap thickness-wavelength-contrast 3D diagram, applicative in the current studies of topological insulating flakes.