Direct Measurement of Folding Angle and Strain Vector in Atomically thin WS$_2$ using Second Harmonic Generation
Structural engineering techniques such as local strain engineering and folding provide functional control over critical optoelectronic properties of 2D materials. Accurate monitoring of local strain vector (both strain amplitude and direction) and folding angle in 2D materials is important to optimize the device performance. Conventionally, the accurate measurement of both strain amplitude and direction requires the combined usage of multiple tools, such as atomic force microscopy (AFM), electron microscopy, Raman spectroscopy, etc. Here, we demonstrated the usage of a single tool, polarization-dependent second harmonic generation (SHG) imaging, to determine the folding angle and strain vector accurately in atomically thin tungsten disulfide (WS2). We find that trilayer WS2 folds with folding angle of 600 show 9 times SHG enhancement due to vector superposition of SH wave vectors coming from the individual folding layers. Strain dependent SHG quenching and enhancement is found parallel and perpendicular respectively to the direction of the compressive strain vector. However, despite a variation in strain angle, the total SHG remains constant which allows us to determine the local strain vector accurately using photoelastic approach. We also demonstrate that band-nesting induced transition (C peak) can highly enhance SHG, which can be significantly modulated by strain. Our results would pave the way to enable novel applications of the TMDs in nonlinear optical device.