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Researcher profile

Kin Wai Chan

Kin Wai Chan contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
MethodologyComputationmath.STStatistics Theory

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Published work

3 published item(s)

preprint2021arXiv

General and Feasible Tests with Multiply-Imputed Datasets

Multiple imputation (MI) is a technique especially designed for handling missing data in public-use datasets. It allows analysts to perform incomplete-data inference straightforwardly by using several already imputed datasets released by the dataset owners. However, the existing MI tests require either a restrictive assumption on the missing-data mechanism, known as equal odds of missing information (EOMI), or an infinite number of imputations. Some of them also require analysts to have access to restrictive or non-standard computer subroutines. Besides, the existing MI testing procedures cover only Wald's tests and likelihood ratio tests but not Rao's score tests, therefore, these MI testing procedures are not general enough. In addition, the MI Wald's tests and MI likelihood ratio tests are not procedurally identical, so analysts need to resort to distinct algorithms for implementation. In this paper, we propose a general MI procedure, called stacked multiple imputation (SMI), for performing Wald's tests, likelihood ratio tests and Rao's score tests by a unified algorithm. SMI requires neither EOMI nor an infinite number of imputations. It is particularly feasible for analysts as they just need to use a complete-data testing device for performing the corresponding incomplete-data test.

0 citations0 reviewsNo code linkedOpen access
preprint2021arXiv

Multiple Improvements of Multiple Imputation Likelihood Ratio Tests

Multiple imputation (MI) inference handles missing data by imputing the missing values $m$ times, and then combining the results from the $m$ complete-data analyses. However, the existing method for combining likelihood ratio tests (LRTs) has multiple defects: (i) the combined test statistic can be negative, but its null distribution is approximated by an $F$-distribution; (ii) it is not invariant to re-parametrization; (iii) it fails to ensure monotonic power owing to its use of an inconsistent estimator of the fraction of missing information (FMI) under the alternative hypothesis; and (iv) it requires nontrivial access to the LRT statistic as a function of parameters instead of data sets. We show, using both theoretical derivations and empirical investigations, that essentially all of these problems can be straightforwardly addressed if we are willing to perform an additional LRT by stacking the $m$ completed data sets as one big completed data set. This enables users to implement the MI LRT without modifying the complete-data procedure. A particularly intriguing finding is that the FMI can be estimated consistently by an LRT statistic for testing whether the $m$ completed data sets can be regarded effectively as samples coming from a common model. Practical guidelines are provided based on an extensive comparison of existing MI tests. Issues related to nuisance parameters are also discussed.

0 citations0 reviewsNo code linkedOpen access
preprint2021arXiv

Optimal Difference-based Variance Estimators in Time Series: A General Framework

Variance estimation is important for statistical inference. It becomes non-trivial when observations are masked by serial dependence structures and time-varying mean structures. Existing methods either ignore or sub-optimally handle these nuisance structures. This paper develops a general framework for the estimation of the long-run variance for time series with non-constant means. The building blocks are difference statistics. The proposed class of estimators is general enough to cover many existing estimators. Necessary and sufficient conditions for consistency are investigated. The first asymptotically optimal estimator is derived. Our proposed estimator is theoretically proven to be invariant to arbitrary mean structures, which may include trends and a possibly divergent number of discontinuities.

0 citations0 reviewsNo code linkedOpen access