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Researcher profile

Kenneth W. Allen

Kenneth W. Allen contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
physics.ins-detphysics.optics

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Published work

6 published item(s)

preprint2016arXiv

An X-Band Waveguide Measurement Technique for the Accurate Characterization of Materials with Low Dielectric Loss Permittivity

In this work, we present a new X-band waveguide (WR90) measurement method that permits the broadband characterization of the complex permittivity for low dielectric loss tangent material specimens with improved accuracy. An electrically-long polypropylene specimen that partially fills the cross-section is inserted into the waveguide and the transmitted scattering parameter (S21) is measured. The extraction method relies on computational electromagnetic simulations, coupled with a genetic algorithm, to match the experimental S21 measurement. The sensitivity of the technique to sample length was explored by simulating specimen lengths from 2.54 to 15.24 cm, in 2.54 cm increments. Analysis of our simulated data predicts the technique will have the sensitivity to measure loss tangent values on the order of 10e-3 for materials such as polymers with relatively low real permittivity values. The ability to accurately characterize low-loss dielectric material specimens of polypropylene is demonstrated experimentally. The method was validated by excellent agreement with a free-space focused-beam system measurement of a polypropylene sheet. This technique provides the material measurement community with the ability to accurately extract material properties of low-loss material specimen over the entire X-band range. This technique could easily be extended to other frequency bands.

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preprint2016arXiv

iQ Cavity for Material Permittivity Characterization

We present an X-band waveguide (WR90) and UHF waveguide (WR1500) measurement method that permits the extraction of the complex permittivity for low dielectric loss tangent material specimen. The extraction method relies on computational electromagnetic (CEM) simulations; coupled with a genetic algorithm; to fit the experimental measurement and the simulated transmitted scattering parameter (S21) of the TE10 mode through the waveguide with the material specimen partially filling the cross-section. This technique provides the material measurement community with the ability to accurately extract material properties of low-loss material specimen.

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preprint2016arXiv

Label-Free Nanoscopy with Contact Microlenses: Super-Resolution Mechanisms and Limitations

Despite all the success with developing super-resolution imaging techniques, the Abbe limit poses a severe fundamental restriction on the resolution of far-field imaging systems based on diffraction of light. Imaging with contact microlenses, such as microspheres or microfibers, can increase the resolution by a factor of two beyond the Abbe limit. The theoretical mechanisms of these methods are debated in the literature. In this work, we focus on the recently expressed idea that optical coupling between closely spaced nanoscale objects can lead to the formation of the modes that drastically impact the imaging properties. These coupling effects emerge in nanoplasmonic or nanocavity clusters, photonic molecules, or various arrays under resonant excitation conditions. The coherent nature of imaging processes is key to understanding their physical mechanisms. We used a cluster of point dipoles, as a simple model system, to study and compare the consequences of coherent and incoherent imaging. Using finite difference time domain modeling, we show that the coherent images are full of artefacts. The out-of-phase oscillations produce zero-intensity points that can be observed with practically unlimited resolution (determined by the noise). We showed that depending on the phase distribution, the nanoplasmonic cluster can appear with the arbitrary shape, and such images were obtained experimentally.

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preprint2016arXiv

Permittivity and permeability determination for high index specimens using partially filled shorted rectangular waveguides

A method for determining the permittivity and permeability for specimens with high refractive index and variable shape is investigated. The method extracts the permeability and permittivity tensor elements from reflection measurements made with a partially-filled shorted rectangular waveguide on an electrically small specimen. Measurements are performed for two isotropic, heavily loaded coaxial magnetic composites. Supporting measurements from a stripline cavity and coaxial airline are used to validate the method. The results demonstrate the methods ability to handle frequency dispersive and high index materials.

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preprint2014arXiv

Super-Resolution Imaging by Arrays of High-Index Spheres Embedded in Transparent Matrices

We fabricated thin-films made from polydimethylsiloxane (PDMS) with embedded high-index (n~1.9-2.2) microspheres for super-resolution imaging applications. To control the position of microspheres, such films can be translated along the surface of the nanoplasmonic structure to be imaged. Microsphere-assisted imaging, through these matrices, provided lateral resolution of ~λ/7 in nanoplasmonic dimer arrays with an illuminating wavelength λ=405 nm. Such thin films can be used as contact optical components to boost the resolution capability of conventional microscopes.

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