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Researcher profile

Jörg Enderlein

Jörg Enderlein contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
physics.chem-phphysics.optics

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Published work

2 published item(s)

preprint2022arXiv

Measuring photophysical transition rates with fluorescence correlation spectroscopy and antibunching

We present a new method that combines fluorescence correlation spectroscopy (FCS) on the microsecond time scale with fluorescence antibunching measurements on the nanosecond time scale for measuring photophysical rate constants of fluorescent molecules. The antibunching measurements allow us to quantify the average excitation rate of fluorescent molecules within the confocal detection volume of the FCS measurement setup. Knowledge of this value allows us then to quantify, in an absolute manner, the intersystem crossing rate and triplet state lifetime from the microsecond temporal decay of the FCS curves. We present a theoretical analysis of the method and estimate the maximum bias caused by the averaging of all quantities (excitation rate, photophysical rates) over the confocal detection volume, and we show that this bias is smaller than 5\% in most cases. We apply the method for measuring the photophysical rate constants of the widely used dyes Rhodamine~110 and ATTO~655.

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preprint2022arXiv

Optimal transfer functions for bandwidth-limited imaging

One of the fundamental limits of classical optical microscopy is the diffraction limit of optical resolution. It results from the finite bandwidth of the optical transfer function (or OTF) of an optical microscope, which restricts the maximum spatial frequencies that are transmitted by a microscope. However, given the frequency support of the OTF, which is fully determined by the used optical hardware, an open and unsolved question is what is the optimal amplitude and phase distribution of spatial frequencies across this support that delivers the "sharpest" possible image. In this paper, we will answer this question and present a general rule how to find the optimal OTF for any given imaging system. We discuss our result in the context of optical microscopy, by considering in particular the cases of wide-field microscopy, confocal Image Scanning Microscopy (ISM), 4pi microscopy, and Structured Illumination Microscopy (SIM). Our results are important for finding optimal deconvolution algorithms for microscopy images, and we demonstrate this experimentally on the example of ISM. Our results can also serve as a guideline for designing optical systems that deliver best possible images, and they can be easily generalized to non-optical imaging such as telescopic imaging, ultrasound imaging, or magnetic resonance imaging.

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