Researcher profile

Jason Huang

Jason Huang contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2020arXiv

Designing Differentially Private Estimators in High Dimensions

We study differentially private mean estimation in a high-dimensional setting. Existing differential privacy techniques applied to large dimensions lead to computationally intractable problems or estimators with excessive privacy loss. Recent work in high-dimensional robust statistics has identified computationally tractable mean estimation algorithms with asymptotic dimension-independent error guarantees. We incorporate these results to develop a strict bound on the global sensitivity of the robust mean estimator. This yields a computationally tractable algorithm for differentially private mean estimation in high dimensions with dimension-independent privacy loss. Finally, we show on synthetic data that our algorithm significantly outperforms classic differential privacy methods, overcoming barriers to high-dimensional differential privacy.

preprint2015arXiv

Nanometer scale elemental analysis in the helium ion microscope using time of flight spectrometry

Time of flight backscattering spectrometry (ToF-BS) was successfully implemented in a helium ion microscope (HIM). Its integration introduces the ability to perform laterally resolved elemental analysis as well as elemental depth profiling on the nm scale. A lateral resolution of $\leq$ 54 nm and a time resolution of $Δt \leq$ 17 ns $(Δt/t \leq 5.4\%)$ are achieved. By using the energy of the backscattered particles for contrast generation, we introduce a new imaging method to the HIM allowing direct elemental mapping as well as local spectrometry. In addition laterally resolved time of flight secondary ion mass spectrometry (ToF-SIMS) can be performed with the same setup. Time of flight is implemented by pulsing the primary ion beam. This is achieved in a cost effective and minimal invasive way that does not influence the high resolution capabilities of the microscope when operating in standard secondary electron (SE) imaging mode. This technique can thus be easily adapted to existing devices. The particular implementation of ToF-BS and ToF-SIMS techniques are described, results are presented and advantages, difficulties and limitations of this new techniques are discussed.