Researcher profile

Irina Snigireva

Irina Snigireva contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2022arXiv

Zn2GeO4/SnO2 nanowire architecture: A correlative spatially resolved X-ray study

Wide bandgap semiconductor heterostructures based on nanowires have attracted great interest as one of the nanoscale building blocks for the development of novel optoelectronic devices. Owing to the critical role of heterogeneities and structural imperfections in the optoelectronic properties, it has become a challenge to investigate in detail the local structure and elemental composition of these systems. Typically, transmission electron microscopy and energy dispersive X-ray spectroscopy are applied to address such issues. Here, using a synchrotron nanobeam probe, we show a correlative spatially-resolved study of the composition, luminescence and local structure of a Zn2GeO4/SnO2 nanowire-based system. Unlike other works, the heterostructures were synthesized by an effective catalyst-free thermal evaporation method and present a skewer-shaped architecture formed by Plateau-Rayleigh instability. Our results highlight the role of diffused impurities on the optical properties of the heterostructure and open new avenues for further heterogeneity studies using the X-ray nanoprobe.

preprint2014arXiv

X-ray diffraction microscopy based on refractive optics

We describe a diffraction microscopy technique based on refractive optics to study structural variations in crystals. The X-ray beam diffracted by a crystal was magnified by beryllium parabolic refractive lenses on a 2D X-ray camera. The microscopy setup was integrated into the 6-circle Huber diffractometer at the ESRF beamline ID06. Our setup allowed us to visualize structural imperfections with a resolution of approximately 1 micrometer. The configuration, however, can easily be adapted for sub-micrometer resolution.