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I. Alexandrov

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physics.ins-det hep-ex nucl-ex

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preprint2011arXiv

On the low-temperature performances of THGEM and THGEM/G-APD multipliers in gaseous and two-phase Xe

The performances of THGEM multipliers in two-phase Xe avalanche mode are presented for the first time. Additional results on THGEM operation in gaseous Xe at cryogenic temperatures are provided. Stable operation of a double-THGEM multiplier was demonstrated in two-phase Xe with gains reaching 600. These are compared to existing data, summarized here for two-phase Ar, Kr and Xe avalanche detectors incorporating GEM and THGEM multipliers. The optical readout of THGEMs with Geiger-mode Avalanche Photodiodes (G-APDs) has been investigated in gaseous Xe at cryogenic temperature; avalanche scintillations were recorded in the Near Infrared (NIR) at wavelengths of up to 950 nm. At avalanche charge gain of 350, the double-THGEM/G-APD multiplier yielded 0.07 photoelectrons per initial ionization electron, corresponding to an avalanche scintillation yield of 0.7 NIR photons per avalanche electron over 4pi. The results are compared with those of two-phase Ar avalanche detectors. The advantages, limitations and possible applications are discussed.

preprint2010arXiv

Direct observation of avalanche scintillations in a THGEM-based two-phase Ar avalanche detector using Geiger-mode APD

A novel concept of optical signal recording in two-phase avalanche detectors, with Geiger-mode Avalanche Photodiodes (G-APD) is described. Avalanche-scintillation photons were measured in a thick Gas Electron Multiplier (THGEM) in view of potential applications in rare-event experiments. The effective detection of avalanche scintillations in THGEM holes has been demonstrated in two-phase Ar with a bare G-APD without wavelength shifter, i.e. insensitive to VUV emission of Ar. At gas-avalanche gain of 400 and under \pm 70^\circ viewing-angle, the G-APD yielded 640 photoelectrons (pe) per 60 keV X-ray converted in liquid Ar; this corresponds to 0.7 pe per initial (prior to multiplication) electron. The avalanche-scintillation light yield measured by the G-APD was about 0.7 pe per avalanche electron, extrapolated to 4pi acceptance. The avalanche scintillations observed occurred presumably in the near infrared (NIR) where G-APDs may have high sensitivity. The measured scintillation yield is similar to that observed by others in the VUV. Other related topics discussed in this work are the G-APD's single-pixel and quenching resistor characteristics at cryogenic temperatures.

preprint2010arXiv

Geiger Mode APD performance in a cryogenic two-phase Ar avalanche detector based on THGEMs

Characteristic properties of a Geiger Mode APD (G-APD) in a THGEM-based cryogenic two-phase Ar avalanche detector were studied in view of potential applications in rare-event experiments. G-APD signal amplitude and noise characteristics at cryogenic temperatures turned out to be superior to those at room temperature. The effective detection of avalanche scintillations from THGEM-multiplier holes in two-phase Ar has been demonstrated using a G-APD without wavelength shifter. At an avalanche gain of 60, the avalanche scintillation yield measured by the G-APD was as high as 0.9 photoelectrons per avalanche electron, extrapolated to 4pi acceptance.

preprint2003arXiv

Verification and Diagnostics Framework in ATLAS Trigger/DAQ

Trigger and data acquisition (TDAQ) systems for modern HEP experiments are composed of thousands of hardware and software components depending on each other in a very complex manner. Typically, such systems are operated by non-expert shift operators, which are not aware of system functionality details. It is therefore necessary to help the operator to control the system and to minimize system down-time by providing knowledge-based facilities for automatic testing and verification of system components and also for error diagnostics and recovery. For this purpose, a verification and diagnostic framework was developed in the scope of ATLAS TDAQ. The verification functionality of the framework allows developers to configure simple low-level tests for any component in a TDAQ configuration. The test can be configured as one or more processes running on different hosts. The framework organizes tests in sequences, using knowledge about components hierarchy and dependencies, and allowing the operator to verify the functionality of any subset of the system. The diagnostics functionality includes the possibility to analyze the test results and diagnose detected errors, e.g. by starting additional tests and understanding reasons of failures. A conclusion about system functionality, error diagnosis and recovery advice are presented to the operator in a GUI. The current implementation uses the CLIPS expert system shell for knowledge representation and reasoning.