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Hong-Yuan Chen

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Published work

2 published item(s)

preprint2022arXiv

Decrypting material performance by wide-field femtosecond interferometric imaging of energy carrier evolution

Energy carrier evolution is crucial for material performance. Ultrafast microscopy has been widely applied to visualize the spatiotemporal evolution of energy carriers. However, direct imaging of small amounts of energy carriers on nanoscale remains difficult due to extremely weak transient signals. Here we present a method for ultrasensitive and high-throughput imaging of energy carrier evolution in space and time. This method combines femtosecond pump-probe techniques with interferometric scattering microscopy (iSCAT), named Femto-iSCAT. The interferometric principle and unique spatially-modulated contrast enhancement increase the transient image contrast by >2 orders of magnitude and enable the exploration of new science. We address three important and challenging problems: transport of different energy carriers at various interfaces, heterogeneous hot electron distribution and relaxation in single plasmonic resonators, and distinct structure-dependent edge state dynamics of carriers and excitons in optoelectronic semiconductors. Femto-iSCAT holds great potential as a universal tool for ultrasensitive imaging of energy carrier evolution in space and time.

preprint2019arXiv

Tip enhanced IR imaging with sub-10 nm resolution and hypersensitivity

IR spectroscopy has been widely used for chemical identification and quantitative analysis of reactions occurring in a specific time and space domains by measuring an average signal of the entire system1. Achieving IR measurements with nanometer-scale spatial resolution is highly desirable to obtain a detailed understanding of the composition, structure and function of interfaces2-5. The challenges in IR nanoscopy yet exist owing to the small molecular cross section and pristine optical diffraction limit. Although atomic force microscopy (AFM) based techniques, such as scattering-type scanning near-field optical microscopy and photothermal-induced resonance microscopy (PTIR), can acquire IR spectroscopy in a few tens of nanometer scale resolution6-9, IR measurements with monolayer level sensitivity remains elusive and can only be realized under critical conditions10,11. Herein, we demonstrate sub-10 nm spatial resolution sampling a volume of ~360 molecules with a strong field enhancement at the sample-tip junction by implementing noble metal substrates (Au, Ag, Pt) in photo-induced force microscopy (PiFM). This technique shows versatility and robustness of PiFM, and is promising for application in interfacial studies with hypersensitivity and super spatial resolution.