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Frederic Y. Gardes

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Published work

2 published item(s)

preprint2021arXiv

Towards low loss non-volatile phase change materials in mid index waveguides

Photonic integrated circuits currently use platform intrinsic thermo-optic and electro-optic effects to implement dynamic functions such as switching, modulation and other processing. Currently, there is a drive to implement field programmable photonic circuits, a need which is only magnified by new neuromorphic and quantum computing applications. The most promising non-volatile photonic components employ phase change materials such as GST and GSST, which had their origin in electronic memory. However, in the optical domain, these compounds introduce significant losses potentially preventing a large number of applications. Here, we evaluate the use of two newly introduced low loss phase change materials, Sb2S3 and Sb2Se3, on a silicon nitride photonic platform. We focus the study on Mach-Zehnder interferometers that operate at the O and C bands to demonstrate the performance of the system. Our measurements show an insertion loss below 0.04 dB/um for Sb2S3 and lower than 0.09 dB/um for Sb2Se3 cladded devices for both amorphous and crystalline phases. The effective refractive index contrast for Sb2S3 on SiNx was measured to be 0.05 at 1310 nm and 0.02 at 1550 nm, whereas for Sb2Se3, it was 0.03 at 1310 nm and 0.05 at 1550 nm highlighting the performance of the integrated device.

preprint2014arXiv

Ultrafast Photomodulation Spectroscopy: a device-level tool for characterizing the flow of light in integrated photonic circuits

Advances in silicon photonics have resulted in rapidly increasing complexity of integrated circuits. New methods are desirable that allow direct characterization of individual optical components in-situ, without the need for additional fabrication steps or test structures. Here, we present a new device-level method for characterization of photonic chips based on a highly localized modulation in the device using pulsed laser excitation. Optical pumping perturbs the refractive index of silicon, providing a spatially and temporally localized modulation in the transmitted light enabling time- and frequency-resolved imaging. We demonstrate the versatility of this all-optical modulation technique in imaging and in quantitative characterization of a variety of properties of silicon photonic devices, ranging from group indices in waveguides, quality factors of a ring resonator to the mode structure of a multimode interference device. Ultrafast photomodulation spectroscopy provides important information on devices of complex design, and is easily applicable for testing on the device-level.