Researcher profile

Frank Mueller

Frank Mueller contributes to research discovery and scholarly infrastructure.

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Published work

6 published item(s)

preprint2020arXiv

Just-in-time Quantum Circuit Transpilation Reduces Noise

Running quantum programs is fraught with challenges on on today's noisy intermediate scale quantum (NISQ) devices. Many of these challenges originate from the error characteristics that stem from rapid decoherence and noise during measurement, qubit connections, crosstalk, the qubits themselves, and transformations of qubit state via gates. Not only are qubits not "created equal", but their noise level also changes over time. IBM is said to calibrate their quantum systems once per day and reports noise levels (errors) at the time of such calibration. This information is subsequently used to map circuits to higher quality qubits and connections up to the next calibration point. This work provides evidence that there is room for improvement over this daily calibration cycle. It contributes a technique to measure noise levels (errors) related to qubits immediately before executing one or more sensitive circuits and shows that just-in-time noise measurements benefit late physical qubit mappings. With this just-in-time recalibrated transpilation, the fidelity of results is improved over IBM's default mappings, which only uses their daily calibrations. The framework assess two major sources of noise, namely readout errors (measurement errors) and two-qubit gate/connection errors. Experiments indicate that the accuracy of circuit results improves by 3-304% on average and up to 400% with on-the-fly circuit mappings based on error measurements just prior to application execution.

preprint2014arXiv

Resilience in Numerical Methods: A Position on Fault Models and Methodologies

Future extreme-scale computer systems may expose silent data corruption (SDC) to applications, in order to save energy or increase performance. However, resilience research struggles to come up with useful abstract programming models for reasoning about SDC. Existing work randomly flips bits in running applications, but this only shows average-case behavior for a low-level, artificial hardware model. Algorithm developers need to understand worst-case behavior with the higher-level data types they actually use, in order to make their algorithms more resilient. Also, we know so little about how SDC may manifest in future hardware, that it seems premature to draw conclusions about the average case. We argue instead that numerical algorithms can benefit from a numerical unreliability fault model, where faults manifest as unbounded perturbations to floating-point data. Algorithms can use inexpensive "sanity" checks that bound or exclude error in the results of computations. Given a selective reliability programming model that requires reliability only when and where needed, such checks can make algorithms reliable despite unbounded faults. Sanity checks, and in general a healthy skepticism about the correctness of subroutines, are wise even if hardware is perfectly reliable.

preprint2014arXiv

Tolerating Silent Data Corruption in Opaque Preconditioners

We demonstrate algorithm-based fault tolerance for silent, transient data corruption in "black-box" preconditioners. We consider both additive Schwarz domain decomposition with an ILU(k) subdomain solver, and algebraic multigrid, both implemented in the Trilinos library. We evaluate faults that corrupt preconditioner results in both single and multiple MPI ranks. We then analyze how our approach behaves when then application is scaled. Our technique is based on a Selective Reliability approach that performs most operations in an unreliable mode, with only a few operations performed reliably. We also investigate two responses to faults and discuss the performance overheads imposed by each. For a non-symmetric problem solved using GMRES and ILU, we show that at scale our fault tolerance approach incurs only 22% overhead for the worst case. With detection techniques, we are able to reduce this overhead to 1.8% in the worst case.

preprint2013arXiv

Evaluating the Impact of SDC on the GMRES Iterative Solver

Increasing parallelism and transistor density, along with increasingly tighter energy and peak power constraints, may force exposure of occasionally incorrect computation or storage to application codes. Silent data corruption (SDC) will likely be infrequent, yet one SDC suffices to make numerical algorithms like iterative linear solvers cease progress towards the correct answer. Thus, we focus on resilience of the iterative linear solver GMRES to a single transient SDC. We derive inexpensive checks to detect the effects of an SDC in GMRES that work for a more general SDC model than presuming a bit flip. Our experiments show that when GMRES is used as the inner solver of an inner-outer iteration, it can "run through" SDC of almost any magnitude in the computationally intensive orthogonalization phase. That is, it gets the right answer using faulty data without any required roll back. Those SDCs which it cannot run through, get caught by our detection scheme.

preprint2013arXiv

Exploiting Data Representation for Fault Tolerance

We explore the link between data representation and soft errors in dot products. We present an analytic model for the absolute error introduced should a soft error corrupt a bit in an IEEE-754 floating-point number. We show how this finding relates to the fundamental linear algebra concepts of normalization and matrix equilibration. We present a case study illustrating that the probability of experiencing a large error in a dot product is minimized when both vectors are normalized. Furthermore, when data is normalized we show that the absolute error is less than one or very large, which allows us to detect large errors. We demonstrate how this finding can be used by instrumenting the GMRES iterative solver. We count all possible errors that can be introduced through faults in arithmetic in the computationally intensive orthogonalization phase, and show that when scaling is used the absolute error can be bounded above by one.

preprint2009arXiv

Remarks on the Order Parameter of the Cuprate High Temperature Superconductors

A large body of spectroscopic data on the cuprate high temperature superconductors (CHTSC) is reviewed in order to determine their order parameter. ASJ, INS, B2g Raman spectra, optical data, NIS "dips", ARPES "dips" and ARPES "kinks" all show the same excitation energy (40 meV for OP95 systems), proportional to the superconducting transition temperature, and it is therefore identified with the order parameter.