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Felipe Vallini

Felipe Vallini appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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physics.opticscond-mat.mtrl-sci

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Published work

7 published item(s)

preprint2016arXiv

Dynamic Hysteresis Probes High-β Nanolaser Emission Regimes

The quest for an integrated light source that promises high energy efficiency and fast modulation for high-performance photonic circuits has led to the development of room-temperature telecom-wavelength nanoscale laser with high spontaneous emission factors, β. The coherence characterization of this type of lasers is inherently difficult with the conventional measurement of output light intensity versus input pump intensity due to the diminishing kink in the measurement curve. We demonstrate the transition from chaotic to coherent emission of a high-β pulse-pump metallo-dielectric nanolaser can be determined by examining the width of a second order intensity correlation peak, which shrinks below and broadens above threshold. Photon fluctuation study, first one ever reported for this type of nanolaser, confirms the validity of this measurement technique. Additionally, we show that the width variation above threshold results from the delayed threshold phenomenon, providing the first indirect observation of dynamical hysteresis in a nanolaser.

0 citations0 reviewsNo code linkedOpen access
preprint2016arXiv

Observation of second-harmonic generation in silicon nitride waveguides through bulk nonlinearities

We present experimental results on the observation of a bulk second-order nonlinear susceptibility derived from both free-space and integrated measurements in silicon nitride. Phase-matching is achieved through dispersion engineering of the waveguide cross-section, independently revealing multiple components of the nonlinear susceptibility, namely X(2)yyy and X(2)xxy. Additionally, we show how the generated second-harmonic signal may be actively tuned through the application of bias voltages across silicon nitride. The nonlinear material properties measured here are anticipated to allow for the practical realization of new nanophotonic devices in CMOS-compatible silicon nitride waveguides, adding to their viability for telecommunication, data communication, and optical signal processing applications.

0 citations0 reviewsNo code linkedOpen access
preprint2015arXiv

Capacitively-Induced Free-Carrier Effects in Nanoscale Silicon Waveguides for Electro-Optic Modulation

We fabricate silicon waveguides in silicon-on-insulator (SOI) wafers clad with either silicon dioxide, silicon nitride, or aluminum oxide, and by measuring the electro-optic behavior of ring resonators, we characterize the cladding-dependent and capacitively-induced free-carrier effects in each of these waveguides. By comparing our measured data with simulation results, we confirm that the observed voltage dependencies of the transmission spectra are due to changes in the concentrations of holes and electrons within the semiconductor waveguide, and we show for the first time how strongly these effects depend on the cladding material which comes into contact with the silicon waveguide. Additionally, the waveguide loss is found to have a particularly high sensitivity to the applied voltage, and may therefore find use in a wide range of applications which require low- or high-loss propagation. Collectively, these phenomena may be incorporated into more complex waveguide designs in the future to create high-efficiency electro-optic modulators.

0 citations0 reviewsNo code linkedOpen access
preprint2015arXiv

Characterizing the effects of free carriers in fully-etched, dielectric-clad silicon waveguides

We theoretically characterize the free-carrier plasma dispersion effect in fully-etched silicon waveguides, with various dielectric material claddings, due to fixed and interface charges at the silicon-dielectric interfaces. The values used for these charges are obtained from the measured capacitance-voltage (C-V) characteristics of SiO2, SiNx, and Al2O3 thin films deposited on silicon substrates. The effect of the charges on the properties of silicon waveguides is then calculated using the semiconductor physics tool Silvaco in combination with the finite-difference time-domain (FDTD) method solver Lumerical. Our results show that, in addition to being a critical factor in the analysis of such active devices as capacitively-driven silicon modulators, this effect should also be taken into account when considering the propagation losses of passive silicon waveguides.

0 citations0 reviewsNo code linkedOpen access
preprint2015arXiv

Transmission Enhancement of High-$k$ Waves through Metal-InGaAsP Multilayers Calculated via Scattering Matrix Method with Semi-Classical Optical Gain

We analyze the steady-state transmission of high-momentum (high-$k$) electromagnetic waves through metal-semiconductor multilayer systems with loss and gain in the near-infrared (NIR). Using a semi-classical optical gain model in conjunction with the scattering matrix method (SMM), we study indium gallium arsenide phosphide (InGaAsP) quantum wells as the active semiconductor, in combination with the metals, aluminum-doped zinc oxide (AZO) and silver (Ag). Under moderate external pumping levels, we find that NIR transmission through Ag/InGaAsP systems may be enhanced by several orders of magnitude relative to the unpumped case, over a large angular and frequency bandwidth. Conversely, transmission enhancement through AZO/InGaAsP systems is orders of magnitude smaller, and has a strong frequency dependence. We discuss the relative importance of Purcell enhancement on our results and validate analytical calculations based on the SMM with numerical finite-difference time domain simulations.

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preprint2012arXiv

Highly luminescent a-SiOx<Er>/SiO2/Si multilayer structure

We have fabricated highly-luminescent samples with erbium-doped amorphous silicon sub-oxide (a-SiOx<Er>) layers on SiO2/Si substrates. The layers are designed to provide a resonance with large modal overlap with the active material and with low quality factor (Q-factor) at 1540 nm. Also, the structure has higher Q-factor resonances in the wavelength range between 600 - 1200 nm. Within this range, strong light emission from a-SiOx defect-related radiative centers and emission from the Er3+ optical transition 4I11/2 - 4I15/2 (980 nm) are observed. A two-fold improvement in photoluminescence (PL) intensity is achieved in the wavelength range between 800 - 1000 nm. The PL intensity in the wavelength range between 1400 - 1700 nm (region of Er3+ 4I13/2 - 4I15/2 transition) is increased four times. This later higher intensity enhancement is apparently caused by optical pumping at 980 nm, higher Q-factor, with subsequent emission from the 4I13/2 level in the low Q resonance at 1540 nm. Further five times emission enhancement is obtained after optimized temperature annealing. The temperature-induced quenching in the PL intensity indicates distinct deactivation energies related to different types of Er centers which are more or less coupled to defects depending on the thermal treatment temperature.

0 citations0 reviewsNo code linkedOpen access
preprint2012arXiv

Induced Optical Losses in Optoelectronic Devices due to Focused Ion Beam Damages

A study of damages caused by gallium focused ion beam (FIB) into III-V compounds is presented. Potential damages caused by local heating, ion implantation, and selective sputtering are presented. Preliminary analysis shows that local heating is negligible. Gallium implantation is shown to occur over areas tens of nanometers thick. Gallium accumulation as well as selective sputtering during III-V compounds milling is expected. Particularly, for GaAs, this effect leads to gallium segregation and formation of metallic clusters. Microdisk resonators were fabricated using FIB milling with different emission currents to analyze these effects on a device. It is shown that for higher emission current, thus higher implantation doses, the cavity quality factor rapidly decreases due to optical scattering losses induced by implanted gallium atoms.

0 citations0 reviewsNo code linkedOpen access