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Eugenio Calandrini

Eugenio Calandrini appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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Published work

2 published item(s)

preprint2022arXiv

High sensitivity nanoporous gold metamaterials for plasmonic sensing

Surface Plasmon Resonance sensors are a well-established class of sensors which includes a very large variety of materials and detection schemes. However, the development of portable devices is still challenging as due to the intrinsic complexity of the optical excitation/detection schemes. In this work we show that Nanoporous gold (NPG) films may overcome these limitations by providing excellent sensitivity without the need of sophisticated fabrication approaches and/or optical setup. The sensing mechanism is related the co-localization of optical energy and analytes into the pores that promote an enhanced light-matter coupling. As result, when molecules are adsorbed into the pores, the NPG film shows a significant spectral shift of the effective plasma frequency and then an abrupt change of the reflectivity. By monitoring the reflectivity in the spectral region close to the plasma frequency (namely the plasma edge) is then possible to detect the analyte. Through a set of experiments we demonstrated a sensitivity exceeding 15.000 nm/RIU in the Near Infrared Range that is comparable with the state of the art of plasmonic metamaterials.

preprint2015arXiv

Mid-Infrared Plasmonic Platform based on Heavily Doped Epitaxial Ge-on-Si: Retrieving the Optical Constants of Thin Ge Epilayers

The n-type Ge-on-Si epitaxial material platform enables a novel paradigm for plasmonics in the mid-infrared, prompting the future development of lab-on-a-chip and subwavelength vibrational spectroscopic sensors. In order to exploit this material, through proper electrodynamic design, it is mandatory to retrieve the dielectric constants of the thin Ge epilayers with high precision due to the difference from bulk Ge crystals. Here we discuss the procedure we have employed to extract the real and imaginary part of the dielectric constants from normal incidence reflectance measurements, by combining the standard multilayer fitting procedure based on the Drude model with Kramers-Kronig transformations of absolute reflectance data in the zero-transmission range of the thin film.