Researcher profile

Dieter Koelle

Dieter Koelle contributes to research discovery and scholarly infrastructure.

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Published work

4 published item(s)

preprint2023arXiv

Characteristic lengthscales of the electrically-induced insulator-to-metal transition

Some correlated materials display an insulator-to-metal transition as the temperature is increased. In most cases this transition can also be induced electrically, resulting in volatile resistive switching due to the formation of a conducting filament. While this phenomenon has attracted much attention due to potential applications, many fundamental questions remain unaddressed. One of them is its characteristic lengths: what sets the size of these filaments, and how does this impact resistive switching properties. Here we use a combination of wide-field and scattering-type scanning near-field optical microscopies to characterize filament formation in NdNiO3 and SmNiO3 thin films. We find a clear trend: smaller filaments increase the current density, yielding sharper switching and a larger resistive drop. With the aid of numerical simulations, we discuss the parameters controlling the filament width and, hence, the switching properties.

preprint2020arXiv

Angular magnetic-field dependence of vortex matching in pinning lattices fabricated by focused or masked helium ion beam irradiation of superconducting YBa$_2$Cu$_3$O$_{7-δ}$ thin films

The angular dependence of magnetic-field commensurability effects in thin films of the cuprate high-critical-temperature superconductor YBa$_{2}$Cu$_{3}$O$_{7-δ}$ (YBCO) with an artificial pinning landscape is investigated. Columns of point defects are fabricated by two different methods of ion irradiation -- scanning the focused 30 keV ion beam in a helium ion microscope or employing the wide-field 75 keV He$^+$ beam of an ion implanter through a stencil mask. Simulations of the ion-target interactions and the resulting collision cascades reveal that with both methods square arrays of defect columns with sub-$μ$m spacings can be created. They consist of dense point-defect clusters, which act as pinning centers for Abrikosov vortices. This is verified by the measurement of commensurable peaks of the critical current and related minima of the flux-flow resistance vs magnetic field at the matching fields. In oblique magnetic fields the matching features are exclusively governed by the component of the magnetic field parallel to the axes of the columnar defects, which confirms that the magnetic flux is penetrated along the defect columns. We demonstrate that the latter dominate the pinning landscape despite of the strong intrinsic pinning in thin YBCO films.

preprint2020arXiv

On-chip sensing of hotspots in superconducting terahertz emitters

Intrinsic Josephson junctions in high-temperature superconductor Bi2Sr2CaCu2O8 are known for their capability to emit high-power terahertz photons with widely tunable frequencies. Hotspots, as inhomogeneous temperature distributions across the junctions, are believed to play a critical role in synchronizing the gauge-invariant phase difference among the junctions, so as to achieve coherent strong emission. Previous optical imaging techniques have indirectly suggested that the hotspot temperature can go higher than the superconductor critical temperature. However, such optical approaches often disturb the local temperature profile and are too slow for device applications. In this paper, we demonstrate an on-chip in situ sensing technique that can precisely quantify the local temperature profile. This is achieved by fabricating a series of micro "sensor" junctions on top of an "emitter" junction and measuring the critical current on the sensors versus the bias current applied to the emitter. This fully electronic on-chip design could enable efficient close-loop control of hotspots in BSCCO junctions and significantly enhance the functionality of superconducting terahertz emitters.

preprint2009arXiv

Imaging of order parameter induced $π$ phase shifts in cuprate superconductors by low-temperature scanning electron microscopy

Low-temperature scanning electron microscopy (LTSEM) has been used to image the supercurrent distribution in ramp-type Josephson junctions between Nb and either the electron-doped cuprate Nd$_{2-x}$Ce$_x$CuO$_{4-y}$ or the hole-doped cuprate YBa$_2$Cu$_3$O$_7$. For zigzag-shaped devices in the short junction limit the critical current is strongly suppressed at zero applied magnetic field. The LTSEM images show, that this is due to the Josephson current counterflow in neighboring 0 and $π$ facets, which is induced by the $d_{x^2-y^2}$ order parameter in the cuprates. Thus, LTSEM provides imaging of the sign change of the superconducting order parameter, which can also be applied to other types of Josephson junctions.