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Dagmar Gerthsen

Dagmar Gerthsen contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2022arXiv

Probing hundreds of individual quantum defects in polycrystalline and amorphous alumina

Quantum two-level systems (TLSs) are present in the materials of qubits and are considered defects because they limit qubit coherence. For superconducting qubits, the quintessential Josephson junction barrier is made of amorphous alumina, which hosts TLSs. However, TLSs are not understood generally -- either structurally or in atomic composition. In this study, we greatly extend the quantitative data available on TLSs by reporting on the physical dipole moment in two alumina types: polycrystalline $\mathrm{\mathrm{γ-Al}_{2}\mathrm{O}_{3}}$ and amorphous $\mathrm{a-Al}\mathrm{O_{x}}$. To obtain the dipole moments $p_z$, rather from the less-structural coupling parameter g, we tune individual TLSs with an external electric field to extract the $p_z$ of the TLSs in a cavity QED system. We find a clear difference in the dipole moment distribution from the film types, indicating a difference in TLS structures. A large sample of approximately 400 individual TLSs are analyzed from the polycrystalline film type. Their dipoles along the growth direction $p_z$ have a mean value of 2.6$\pm$0.3 Debye (D) and standard deviation $σ$ = 1.6$\pm$0.2 D . The material distribution fits well to a single Gaussian function. Approximately 200 individual TLSs are analyzed from amorphous films. Both the mean $p_z$ =4.6$\pm$0.5 D and $σ$ =2.5$\pm$0.3 D are larger. Amorphous alumina also has some very large $p_z$, > 8.6 D, in contrast to polycrystalline which has none of this moment. These large moments agree only with oxygen-based TLS models. Based on data and the candidate models (delocalized O and hydrogen-based TLSs), we find polycrystalline alumina has smaller ratio of O-based to H-based TLS than amorphous alumina.

preprint2017arXiv

Free-running Sn precipitates: an efficient phase separation mechanism for metastable GeSn epilayers

We report on the temperature stability of pseudomorphic GeSn films grown by molecular beam epitaxy on Ge(001) substrates. Both the growth temperature-dependence and the influence of post-growth annealing steps were investigated. In either case we observe that decomposition of metastable epilayers with Sn concentrations around 10% sets in above 230°C, the eutectic temperature of the Ge/Sn system. Time-resolved annealing experiments in a scanning electron microscope reveal the crucial role of liquid Sn droplets in this phase separation process. Driven by a gradient of the chemical potential, the Sn droplets move on the surface along preferential crystallographic directions, thereby taking up Sn and Ge from the strained GeSn layer at their leading edge. While Sn-uptake increases the volume of the melt, dissolved Ge becomes re-deposited by a liquid-phase epitaxial process at the trailing edge of the droplet. Secondary droplets are launched from the rims of the single-crystalline Ge trails into intact regions of the GeSn film, leading to an avalanche-like transformation front between the GeSn film and re-deposited Ge. This process makes phase separation of metastable GeSn layers particularly efficient at rather low temperatures.