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Researcher profile

Daeyeong Lee

Daeyeong Lee contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
cond-mat.mes-hallcond-mat.mtrl-sci

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Published work

2 published item(s)

preprint2015arXiv

P-type polar transition of chemically doped multilayer MoS2 transistor

The accessibility of both n-type and p-type MoS2 FET is necessary for complementary device applications involving MoS2. However, MoS2 PFET is rarely achieved due to pinning effect resulting high Rc at metal-MoS2 interface and the inherently strong n-type property of the MoS2 material. In this study, we realized a high-performance multi-layer MoS2 PFET via controllable chemical doping, which has an excellent on/off ratio of 107 and a maximum hole mobility of 72 cm2/Vs at room temperature, and these values are further exceeding to 109 and 132 cm2/Vs at 133K. In addition, we revealed that large Rc hindered the polar transition of MoS2 FET from n-type to p-type, meanwhile channel Rs limited Ion of PFET. Therefore it is suggested that reducing Rc at high work function metal-MoS2 interface and p-type doping of channel were necessary for achieving high performance MoS2 PFET. Based on the high performance PFET, we successfully demonstrated a MoS2 CMOS inverter by integrating NFET and PFET.

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preprint2015arXiv

Ultimate Thin Vertical p-n Junction Composed of 2D Layered Molybdenum Disulfide

Semiconducting 2D crystals are currently receiving significant attention due to their great potential to be an ultra-thin body for efficient electrostatic modulation which enables to overcome the limitations of silicon technology. Here we report that, as a key building block for 2D semiconductor devices, vertical p-n junctions are fabricated in ultrathin MoS2 by introducing AuCl3 and benzyl viologen dopants. Unlike usual unipolar MoS2, the MoS2 p-n junctions show (i) ambipolar carrier transport, (ii) current rectification via modulation of potential barrier in films thicker than 8 nm, and (iii) reversed current rectification via tunneling in films thinner than 8 nm. The ultimate thinness of the vertical p-n homogeneous junctions in MoS2 is experimentally found to be 3 nm, and the chemical doping depth is found to be 1.5 nm. The ultrathin MoS2 p-n junctions present a significant potential of the 2D crystals for flexible, transparent, high-efficiency electronic and optoelectronic applications.

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