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D. Jackuline Moni

D. Jackuline Moni appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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2 published item(s)

preprint2014arXiv

Design and Development of a Nanoscale Multi Probe System Using Open Source SPM Controller and GXSM Software: A Tool of Nanotechnology

We report our design, development, installation and troubleshooting of an open source Gnome X Scanning Microscopy (GXSM) software package for controlling and processing of modern Scanning Probe Microscopy (SPM) system as a development tool of Nanotechnology. GXSM is a full featured analysis tool for the characterization of nanomaterials with different controlling tools like Atomic Force Microscopy (AFM), Scanning Tunneling Spectroscopy (STS), scanning tunneling microscopy (STM), Nanoindentation and etc.,. This developed package tool consists of Digital Signal Processing (DSP) and image processing system of SPM. A digital signal processor (DSP) subsystem runs the feedback loop, generates the scanning signals and acquires the data during SPM measurements. With installed SR-Hwl plug-in this developed package was tested in no hardware mode.

preprint2014arXiv

Design and Simulation of Symmetric Nanostructures Using Two-Beam Modulated Interference Lithography Technique

Laser Interference Lithography (LIL) is a versatile fabrication method for patterning sub-micron structures in arrays covering large areas. It is a facile and fast mask-less lithography process to produce large area periodic patterns. The objective in this study is to simulate and design periodic and quasi-periodic 1D, 2D and 3D nanostructures using two-beam interference technique. We designed and simulated periodic and quasi-periodic structures by two-beam interference patterning using a MATLAB program by varying angle of incidence, wavelength and geometry. The generated patterns/features depend on the interference intensity, wavelength, slit separation and angle of incidence. Using this technique, we can achieve potentially high-volume of uniformity, throughput, process control, and repeatability. By varying different input parameters, we have optimized simulated patterns with controlled periodicity, density and aspect ratio also it can be programmed to obtain images of interference results showing interference intensity distributions.