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Chung-Chuan Lai

Chung-Chuan Lai contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2022arXiv

Double-GEM based thermal neutron detector prototype

The Helium-3 shortage and the growing interest in neutron science constitute a driving factor in developing new neutron detection technologies. In this work, we report the development of a double-GEM detector prototype that uses a $^{10}$B$_4$C layer as a neutron converter material. GEANT4 simulations were performed predicting an efficiency of 3.14(10) %, agreeing within 2.7 $σ$ with the experimental and analytic detection efficiencies obtained by the detector when tested in a 41.8 meV thermal neutron beam. The detector is position sensitive, equipped with a 256+256 strip readout connected to resistive chains, and achieves a spatial resolution better than 3 mm. The gain stability over time was also measured with a fluctuation of about 0.2 %h$^{-1}$ of the signal amplitude. A simple data acquisition with only 5 electronic channels is sufficient to operate this detector.

preprint2022arXiv

Effect of substrate roughness and material selection on the microstructure of sputtering deposited boron carbide thin films

Amorphous boron carbide (B4C) thin films are by far the most popular form for the neutron converting layers in the 10B-based neutron detectors, which are a rising trend in detector technologies in response to the increasing scarcity and price of 3He, the standard material for neutron detection. The microstructure of the B4C films is closely related to the important properties, e.g. density and adhesion, for the converting layers, which eventually affect the detection efficiency and the long-term stability of the detectors. To study the influence from substrates of different roughness and materials, the B4C films were deposited on polished Si substrates with Al, Ti, and Cu buffer layers and unpolished Si, Al, Ti, and Cu substrates by direct current magnetron sputtering at a substrate temperature of 623 K. The tapered columnar grains and nodular defects, generally observed in SEM images, indicated a strong shadowing effect where voids were introduced around the grains. The change in the grain size did not show a direct dependence to the substrate roughness, acquired from the surface profile, nor to the mass density of the films, obtained from reflectivity patterns. However, films with non-uniform size of columnar grains were deposited on substrates with high skewness, leading to a drop of mass density from ~95 % down to ~70 % of tabulated bulk density. On the other hand, similar microstructures and mass density were obtained from the films deposited on Al, Ti, and Cu of different roughness and good adhesion were observed from cross-cut adhesion tests, showing the reliability of sputtering deposited B4C films on common structural materials in neutron detectors.