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Researcher profile

C. Józsa

C. Józsa contributes to research discovery and scholarly infrastructure.

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cond-mat.mes-hall

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Published work

2 published item(s)

preprint2011arXiv

Comparison between charge and spin transport in few layer graphene

Transport measurements on few layer graphene (FLG) are important as they interpolate between the properties of single layer graphene (SLG) as a true 2-dimensional material and the 3-dimensional bulk properties of graphite. In this article we present 4-probe local charge transport and non-local spin valve and spin precession measurements on lateral spin field-effect transistors (FET) on FLG. We study systematically the charge and spin transport properties depending on the number of layers and the electrical back gating of the device. We explain the charge transport measurements by taking the screening of scattering potentials into account and use the results to understand the spin data. The measured samples are between 3 and 20 layers thick and we include in our analysis our earlier results of the measurements on SLG for comparison. In our room temperature spin transport measurements we manage to observe spin signals over distances up to 10 u m and measure spin-relaxation times up to tau_s ~500 ps, about 4 times higher than in SLG. We calculate the density of states (DOS) of FLG using a zone-folding scheme to determine the charge diffusion coefficient D_C from the square resistance R_S. The resulting D_C and the spin diffusion coefficient D_S show similar values and depend only weakly on the number of layers and gate induced charge carriers. We discuss the implications of this on the identification of the spin-relaxation mechanism.

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preprint2009arXiv

Electronic spin transport in graphene field effect transistors

Spin transport experiments in graphene, a single layer of carbon atoms, indicate spin relaxation times that are significantly shorter than the theoretical predictions. We investigate experimentally whether these short spin relaxation times are due to extrinsic factors, such as spin relaxation caused by low impedance contacts, enhanced spin flip processes at the device edges or the presence of an aluminium oxide layer on top of graphene in some samples. Lateral spin valve devices using a field effect transistor geometry allowed for the investigation of the spin relaxation as a function of the charge density, going continuously from metallic hole to electron conduction (charge densities of $n\sim 10^{12}$cm$^{-2}$) via the Dirac charge neutrality point ($n \sim 0$). The results are quantitatively described by a one dimensional spin diffusion model where the spin relaxation via the contacts is taken into account. Spin valve experiments for various injector/detector separations and spin precession experiments reveal that the longitudinal (T$_1$) and the transversal (T$_2$) relaxation times are similar. The anisotropy of the spin relaxation times $τ_\parallel$ and $τ_\perp$, when the spins are injected parallel or perpendicular to the graphene plane, indicates that the effective spin orbit fields do not lie exclusively in the two dimensional graphene plane. Furthermore, the proportionality between the spin relaxation time and the momentum relaxation time indicates that the spin relaxation mechanism is of the Elliott-Yafet type. For carrier mobilities of 2-5$\times 10^3$ cm$2^$/Vs and for graphene flakes of 0.1-2 $μ$m in width, we found spin relaxation times of the order of 50-200 ps, times which appear not to be determined by the extrinsic factors mentioned above.

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