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Researcher profile

B. Reulet

B. Reulet contributes to research discovery and scholarly infrastructure.

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cond-mat.mes-hallcond-mat.supr-concond-mat.stat-mechphysics.ins-det

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Published work

5 published item(s)

preprint2010arXiv

Comment on "Experimental Determination of the Statistics of Photons Emitted by a Tunnel Junction"

A very recent article [(1) E. Zakka-Bajjani et al., PRL104, 206802 (2010)] has addressed the problem of how the statistics of electrons crossing a quantum conductor influences that of the photons they emit. It is however not clear that the detection used in [1] is sensitive to emitted photons and not to the overall electromagnetic fluctuations, which include vacuum fluctuations. We show that the proof in [1] that non-symmetrized noise is detected is erroneous: supposing that the detection simply takes the square of the voltage, i.e. is sensitive to vacuum fluctuations, leads to identical results. We demonstrate that all the results can be explained in terms of usual gaussian voltage fluctuations instead of photon statistics. Finally, it is found in [1] that the photon noise is gaussian for a tunnel junction, for which the electron counting statistics is poissonian. We show that this result is beyond the experimental sensitivity by at least one order of magnitude, and thus is also incorrect.

0 citations0 reviewsNo code linkedOpen access
preprint2010arXiv

Energy resolution of terahertz single-photon-sensitive bolometric detectors

We report measurements of the energy resolution of ultra-sensitive superconducting bolometric detectors. The device is a superconducting titanium nanobridge with niobium contacts. A fast microwave pulse is used to simulate a single higher-frequency photon, where the absorbed energy of the pulse is equal to the photon energy. This technique allows precise calibration of the input coupling and avoids problems with unwanted background photons. Present devices have an intrinsic full-width at half-maximum energy resolution of approximately 23 terahertz, near the predicted value due to intrinsic thermal fluctuation noise.

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preprint2009arXiv

Evidence for Two Time Scales in Long SNS Junctions

We use microwave excitation to elucidate the dynamics of long superconductor / normal metal / superconductor Josephson junctions. By varying the excitation frequency in the range 10 MHz - 40 GHz, we observe that the critical and retrapping currents, deduced from the dc voltage vs. dc current characteristics of the junction, are set by two different time scales. The critical current increases when the ac frequency is larger than the inverse diffusion time in the normal metal, whereas the retrapping current is strongly modified when the excitation frequency is above the electron-phonon rate in the normal metal. Therefore the critical and retrapping currents are associated with elastic and inelastic scattering, respectively.

0 citations0 reviewsNo code linkedOpen access
preprint2009arXiv

Full Counting Statistics of Avalanche Transport: an Experiment

We report the first measurement of high order cumulants of the current fluctuations in an avalanche diode run through by a stationary dc current. Such a system is archetypic of devices in which transport is governed by a collective mechanism, here charge multiplication by avalanche. We have measured the first 5 cumulants of the probability distribution of the current fluctuations. We show that the charge multiplication factor is distributed according to a power law that is different from that of the usual avalanche below breakdown, when avalanches are well separated.

0 citations0 reviewsNo code linkedOpen access