Researcher profile

Anna Fontcuberta i Morral

Anna Fontcuberta i Morral contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2020arXiv

Heterotwin Zn3P2 superlattice nanowires: the role of indium insertion in the superlattice formation mechanism and their optical properties

Zinc phosphide, Zn3P2, nanowires constitute prospective building blocks for next generation solar cells due to the combination of suitable optoelectronic properties and an abundance of the constituting elements in the Earths crust. The generation of periodic superstructures along the nanowire axis could provide an additional mechanism to tune their functional properties. Here we present the vapour-liquid-solid growth of zinc phosphide superlattices driven by periodic heterotwins. This uncommon planar defect involves the exchange of Zn by In at the twinning boundary. We find that the zigzag superlattice formation is driven by reduction of the total surface energy of the liquid droplet. The chemical variation across the heterotwin does not affect the homogeneity of the optical proerties, as measured by cathodoluminescence. The basic understanding provided here brings new perspectives on the use of II-V semiconductors in nanowire technology.

preprint2019arXiv

Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity

Piezoelectric nanowires are promising materials for sensing, actuation and energy harvesting, due to their enhanced properties at the nanoscale. However, quantitative characterization of piezoelectricity in nanomaterials is challenging due to practical limitations and the onset of additional electromechanical phenomena, such as the triboelectric and piezotronic effects. Here, we present an open-circuit conductive atomic force microscopy (cAFM) methodology for quantitative extraction of the axial piezoelectric coefficients of nanowires. We show, both theoretically and experimentally, that the standard short-circuit cAFM mode is inadequate for piezoelectric characterization of nanowires, and that such measurements are governed by competing mechanisms. We introduce an alternative open-circuit configuration, and employ time-resolved electromechanical measurements, to extract the piezoelectric coefficients. This method was applied to GaAs, an important semiconductor, with relatively low piezoelectric coefficients. The results obtained for GaAs,~0.4-1 pm/V, are in good agreement with existing knowledge and theory. Our method represents a significant advance in understanding the coexistence of different electromechanical effects, and in quantitative piezoelectric nanoscale characterization. The easy implementation will enable better understanding of electromechanics at the nanoscale.