Researcher profile

Aleksandra B. Biedron

Aleksandra B. Biedron contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2026arXiv

Low-loss Nb on Si superconducting resonators from a dual-use spintronics deposition chamber and with acid-free post-processing

Magnetic impurities are known to degrade superconductivity. For this reason, physical vapor deposition chambers that have previously been used for magnetic materials have generally been avoided for making high-quality superconducting resonator devices. In this article, we show by example that such chambers can be used for this purpose; with Nb films sputtered in a chamber that continues to be used for magnetic materials, we demonstrate compact (\SI{3}{\micro\meter} gap) coplanar waveguide resonators with low-power internal quality factors near one million. We achieve this using a resist strip bath with no post-fabrication acid treatment, which results in performance comparable to previous strip baths with acid treatments. We also find evidence that this improved resist strip bath provides a better surface chemical template for post-fabrication hydrogen fluoride processing. These results are consistent across three Si substrate preparation methods, including a \SI{700}{\celsius} anneal. These results will inform nanofabrication for other superconducting materials and the integration of magnetic materials for hybrid systems.

preprint2026arXiv

Secondary Species formed from ionic liquid electrospray ion plume impacts with propellant thin films

The operational lifetime of ionic liquid electrospray propulsion systems is limited by plume-extractor electrode interactions. Over time, propellant accumulation, surface erosion, and electrical shorts degrade the extractor and therefore restrict the total impulse throughput. Characterizing the secondary species generated by plume impacts with deposited ionic liquid is therefore essential to understanding and mitigating these degradation pathways. A surface analysis technique known as Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS), in the form of a custom electrospray laboratory diagnostic and an analytical-grade system, yields a comprehensive analysis of secondary ions formed from energetic ion beam impacts with ionic liquid thin-film substrates. Results revealed nearly identical positive secondary ion species for both EMI-BF4 and EMI-Im thin films, whereas EMI-Im produced a more diverse set of negative ions consistent with the greater chemical complexity of its anion. The analytical-grade SIMS spectra revealed many relatively high mass-to-charge ratio secondary ions likely below the detection limit for the laboratory diagnostic, thus shifting the average m/z value to above the monomer mass for most spectra. Finally, optical profilometry analysis reveals an estimated 0.5 nm/min sputter rate for an electrospray ion plume bombarding an ionic liquid thin film.