Researcher profile

Akira Fujiwara

Akira Fujiwara contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate

Trust snapshot

Quick read

Trust 15 - UnverifiedVerification L1Unclaimed author
3works
0followers
2topics
4close collaborators

Actions

Decide how to stay connected

Follow researcher0

Identity and collaboration

How to connect with this researcher

Claiming links this public author record to a researcher profile and unlocks direct collaboration workflows.

Log in to claim

Direct collaboration

Open a focused conversation when the fit is right

Claim this author entity first to unlock direct invitations.

Research graph

See the researcher in context

Open full explorer

Inspect adjacent work, topics, institutions and collaborators without jumping out to a separate graph page.

Building this graph slice

BZPEER is loading the nearby papers, people, topics and institutions for this page.

Published work

3 published item(s)

preprint2023arXiv

Advances toward high-accuracy gigahertz operation of tunable-barrier single-hole pumps in silicon

Precise and reproducible current generation is key to realize quantum current standards in metrology. A promising candidate is a tunable-barrier single-charge pump, which can accurately transfer single charges one by one with an error rate of less than ppm level. Although several high-accuracy measurements have revealed such a high performance of the pumps, it is necessary to further pursue the possibility of high-precision operation toward reproducible generation of the pumping current in many devices. Here, we investigate in detail a silicon single-hole pumps, which are potentially expected to have a superior performance to single-electron pumps because of a heavy effective mass of holes. Temperature dependence measurements of current generated by the single-hole pump revealed a high energy selectivity of the tunnel barrier, which is a critical parameter to achieve high-accuracy operation. In addition, we applied the dynamic gate compensation technique to the single-hole pump and confirm the further performance improvement. Furthermore, we demonstrate gigahertz operation of a single-hole pump with an estimated lower bound of an error rate of around 0.01 ppm. These results imply a superior capability of single-hole pumps in silicon toward high-accuracy, high-speed, and stable single-charge pumping appropriate for not only metrological applications but also quantum device applications.

preprint2020arXiv

Realisation of a quantum current standard at liquid helium temperature with sub-ppm reproducibility

A silicon electron pump operating at the temperature of liquid helium has demonstrated repeatable operation with sub-ppm accuracy. The pump current, approximately 168 pA, is measured by three laboratories, and the measurements agree with the expected current ef within the uncertainties which range from 0.2 ppm to 1.3 ppm. All the measurements are carried out in zero applied magnetic field, and the pump drive signal is a sine wave. The combination of simple operating conditions with high accuracy demonstrates the possibility that an electron pump can operate as a current standard in a National Measurement Institute. We also discuss other practical aspects of using the electron pump as a current standard, such as testing its robustness to changes in the control parameters, and using a rapid tuning procedure to locate the optimal operation point..

preprint2011arXiv

Evaluation of a gate capacitance in the sub-aF range for a chemical field-effect transistor with a silicon nanowire channel

An evaluation of the gate capacitance of a field-effect transitor (FET) whose channel length and width are several ten nanometer, is a key point for sensors applications. However, experimental and precise evaluation of capacitance in the aF range or less has been extremely difficult. Here, we report an extraction of the capacitance down to 0.55 aF for a silicon FET with a nanoscale wire channel whose width and length are 15 and 50 nm, respectively. The extraction can be achieved by using a combination of four kinds of measurements: current characteristics modulated by double gates, random-telegraph-signal noise induced by trapping and detrapping of a single electron, dielectric polarization noise, and current characteristics showing Coulomb blockade at low temperature. The extraction of such a small gate capacitance enables us to evaluate electron mobility in a nanoscale wire using a classical model of current characteristics of a FET.