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A. K. Rumaiz

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2 publications

preprint2015arXiv

A loss for photoemission is a gain for Auger: Direct experimental evidence of crystal-field splitting and charge transfer in photoelectron spectroscopy

We find a new 5 eV satellite in the Ti 1s photoelectron spectrum of the transition-metal oxide SrTiO3_3. This satellite appears in addition to the well-studied 13 eV structure that is typically associated with the Ti 2p core line. We give direct experimental evidence that the presence of two satellites is due to the crystal-field splitting of the metal 3d orbitals. They originate from ligand 2p t2g_{2g} →\rightarrow metal 3d t2g_{2g} and ligand 2p eg_g →\rightarrow metal 3d eg_g monopole charge-transfer excitations within the sudden approximation of quantum mechanics. This assignment is made by the energetics of the resonant and high-energy threshold behaviors of the Ti K-L2_2L3_3 Auger decay that follows Ti 1s photo-ionization.

preprint2015arXiv

Stoichiometry Dependence of Potential Screening at La(1−δ)_{(1-δ)}Al(1+δ)_{(1+δ)}O3_3/SrTiO3_3 Interfaces

Hard x-ray photoelectron spectroscopy (HAXPES) and variable kinetic energy x-ray photoelectron spectroscopy (VKE-XPS) analyses have been performed on 10 unit cell La(1−δ)_{(1-δ)}Al(1+δ)_{(1+δ)}O3_3 films, with La:Al ratios of 1.1, 1.0, and 0.9, deposited on SrTiO3_3. Of the three films, only the Al-rich film was known to have a conductive interface. VKE-XPS, coupled with maximum entropy analysis, shows significant differences in the compositional depth profile between the Al-rich, the La-rich, and stoichiometric films; significant La enrichment at the interface is observed in the La-rich and stoichiometric films, while the Al-rich shows little to no intermixing. Additionally, the La-rich and stoichiometric films show a high concentration of Al at the surface, which is not observed in the Al-rich film. HAXPES valence band (VB) analysis shows a broadening of the VB for the Al-rich sample relative to the stoichiometric and La-rich samples, which have insulating interfaces. This broadening is consistent with an electric field across the Al-rich film. These results are consistent with a defect driven electronic reconstruction.

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