Abstract
Understanding microscopic processes in materials and devices that can be switched by light requires experimental access to dynamics on nanometer length and femtosecond time scales. Here, we introduce ultrafast dark-field electron microscopy, tailored to map the order parameter across a structural phase transition. We track the evolution of charge-density wave domains in 1T-TaS2 after ultrashort laser excitation, elucidating relaxation pathways and domain wall dynamics. The unique benefits of selective contrast enhancement will inspire future beam shaping technology in ultrafast transmission electron microscopy.
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