Abstract
We present the fabrication and characterization of an artificial crystal structure formed from a thin-film of silicon which has a full phononic bandgap for microwave X-band phonons and a two-dimensional pseudo-bandgap for near-infrared photons. An engineered defect in the crystal structure is used to localize optical and mechanical resonances in the bandgap of the planar crystal. Two-tone optical spectroscopy is used to characterize the cavity system, showing a large vacuum coupling rate of 220kHz between the fundamental optical cavity resonance at 195THz and a co-localized mechanical resonance at 9.3GHz.
Connections
Explore this paper’s authors, topics and related work.
Building this map preview
BZPEER is loading the nearby papers, people, topics and institutions for this page.
Reviews 0
Write a review
No reviews yet.
Discussion 0
Add a comment
No comments yet.