Abstract

We study the complexity of small-depth Frege proofs and give the first tradeoffs between the size of each line and the number of lines. Existing lower bounds apply to the overall proof size -- the sum of sizes of all lines -- and do not distinguish between these notions of complexity. For depth-dd Frege proofs of the Tseitin principle on the n×nn \times n grid where each line is a size-ss formula, we prove that exp⁡(n/2Ω(dlog⁡s))\exp(n/2^{Ω(d\sqrt{\log s})}) many lines are necessary. This yields new lower bounds on line complexity that are not implied by Håstad's recent exp⁡(nΩ(1/d))\exp(n^{Ω(1/d)}) lower bound on the overall proof size. For s=poly(n)s = \mathrm{poly}(n), for example, our lower bound remains exp⁡(n1−o(1))\exp(n^{1-o(1)}) for all d=o(log⁡n)d = o(\sqrt{\log n}), whereas Håstad's lower bound is exp⁡(no(1))\exp(n^{o(1)}) once d=ωn(1)d = ω_n(1). Our main conceptual contribution is the simple observation that techniques for establishing correlation bounds in circuit complexity can be leveraged to establish such tradeoffs in proof complexity.

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