Topological phase transition and two dimensional topological insulators in Ge-based thin films

preprint2013arXivOpen access

Abstract

We discuss possible topological phase transitions in Ge-based thin films of Ge(Bix_xSb1−x_{1-x})2_2Te4_4 as a function of layer thickness and Bi concentration xx using the first principles density functional theory framework. The bulk material is a topological insulator at xx = 1.0 with a single Dirac cone surface state at the surface Brillouin zone center, whereas it is a trivial insulator at xx = 0. Through a systematic examination of the band topologies we predict that thin films of Ge(Bix_xSb1−x_{1-x})2_2Te4_4 with xx = 0.6, 0.8 and 1.0 are candidates for two-dimensional (2D) topological insulators, which would undergo a 2D topological phase transition as a function of xx. A topological phase diagram for Ge(Bix_xSb1−x_{1-x})2_2Te4_4 thin films is presented to help guide their experimental exploration.

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