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The test of the electronics system for the BESIII ETOF upgrade

It is proposed to upgrade the endcap time-of-flight (ETOF) of the Beijing Spectrometer III (BESIII) with multi-gap resistive plate chamber (MRPC), aiming at overall time resolution about 80 ps. After the entire electronics system is ready, some experiments, such as heat radiating, irradiation hardness and large-current beam tests,are carried out to certify the electronics' reliability and stability. The on-detector test of the electronics is also performed with the beam at BEPCII E3 line, the test results indicate that the electronics system fulfills its design requirements.

preprint2016arXivOpen access
Wang XiaozhuangDai HongliangWu ZhiHeng YuekunZhang JieCao PingJi XiaoluLi ChengSun WeijiaWang SiyuWang Yun
hep-exphysics.ins-det
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Wang XiaozhuangDai HongliangWu ZhiHeng YuekunZhang JieCao PingJi XiaoluLi ChengSun WeijiaWang SiyuWang Yun

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