Abstract
In this paper, we show that it is possible to overcome one of the fundamental limitations of super-resolution microscopy techniques: the necessity to be in an \emph{optically homogeneous} environment. Using recent modal approximation results we show as a proof of concept that it is possible to recover the position of a single point-like emitter in a \emph{known resonant environment} from far-field measurements with a precision two orders of magnitude below the classical Rayleigh limit. The procedure does not involve solving any partial differential equation, is computationally light (optimisation in with of the order of ) and therefore suited for the recovery of a very large number of single emitters.
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