Abstract
We measure frequency- and dissipation-quadrature noise in superconducting lithographed microwave resonators with sensitivity near the vacuum noise level using a Josephson parametric amplifier. At an excitation power of 100~nW, these resonators show significant frequency noise caused by two-level systems. No excess dissipation-quadrature noise (above the vacuum noise) is observed to our measurement sensitivity. These measurements demonstrate that the excess dissipation-quadrature noise is negligible compared to vacuum fluctuations, at typical readout powers used in micro-resonator applications. Our results have important implications for resonant readout of various devices such as detectors, qubits and nano-mechanical oscillators.
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