Solution of the fermionic entanglement problem with interface defects

preprint2010arXivOpen access

Abstract

We study the ground-state entanglement of two halves of a critical transverse Ising chain, separated by an interface defect. From the relation to a two-dimensional Ising model with a defect line we obtain an exact expression for the continuously varying effective central charge. The result is relevant also for other fermionic chains.

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