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Robust formation of skyrmions and topological Hall effect in epitaxial thin films of MnSi

Magneto-transport properties have been investigated for epitaxial thin films of B20-type MnSi grown on Si(111) substrates. Both Lorentz transmission electron microscopy (TEM) images and topological Hall effect (THE) clearly point to the robust formation of skyrmions over a wide temperature-magnetic field region. New features distinct from those of bulk MnSi are observed for epitaxial MnSi films: a shorter (nearly half) period of the spin helix and skyrmions, and an opposite sign of THE. These observations suggest versatile features of skyrmion-induced THE beyond the current understanding.

preprint2012arXivOpen access
Yufan LiN. KanazawaX. Z. YuA. TsukazakiM. KawasakiM. IchikawaX. F. JinF. KagawaY. Tokura
cond-mat.mes-hallcond-mat.str-elcond-mat.mtrl-sci
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Open access9 authors3 topics
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Yufan LiN. KanazawaX. Z. YuA. TsukazakiM. KawasakiM. IchikawaX. F. JinF. KagawaY. Tokura

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