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Radiation Tolerance of 65nm CMOS Transistors

We report on the effects of ionizing radiation on 65nm CMOS transistors held at approximately -20C during irradiation. The pattern of damage observed after a total dose of 1 Grad is similar to damage reported in room temperature exposures, but we observe less damage than was observed at room temperature.

preprint2015arXivOpen access
M. KrohnB. BenteleJ. P. CumalatS. R. WagnerD. C. ChristianG. DeptuchF. FahimJ. HoffA. Shenai
hep-exphysics.ins-det
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Open access9 authors2 topics
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M. KrohnB. BenteleJ. P. CumalatS. R. WagnerD. C. ChristianG. DeptuchF. FahimJ. HoffA. Shenai

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