Quenched and Annealed Critical Points in Polymer Pinning Models

preprint2008arXivOpen access

Abstract

We consider a polymer with configuration modeled by the path of a Markov chain, interacting with a potential u+Vnu+V_n which the chain encounters when it visits a special state 0 at time nn. The disorder (Vn)(V_n) is a fixed realization of an i.i.d. sequence. The polymer is pinned, i.e. the chain spends a positive fraction of its time at state 0, when uu exceeds a critical value. We assume that for the Markov chain in the absence of the potential, the probability of an excursion from 0 of length nn has the form n−cϕ(n)n^{-c}ϕ(n) with c≥1c \geq 1 and ϕϕ slowly varying. Comparing to the corresponding annealed system, in which the VnV_n are effectively replaced by a constant, it is known that the quenched and annealed critical points differ at all temperatures for 3/2<c<23/2<c<2 and c>2c>2, but only at low temperatures for c<3/2c<3/2. For high temperatures and 3/2<c<23/2<c<2 we establish the exact order of the gap between critical points, as a function of temperature. For the borderline case c=3/2c=3/2 we show that the gap is positive provided ϕ(n)→0ϕ(n) \to 0 as n→∞n \to \infty, and for c>3/2c >3/2 with arbitrary temperature we provide a new proof that the gap is positive, and extend it to c=2c=2.

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